Hsi-Jian Lee and jer-Dar Lee
Department of Computer Science and Information Engineering
National Chiao Tung University
Hsinchu, Tuiwan 3005
This paper presents an intensity-based corner detector based on fitting an ideal corner feature, represented by a set of parameters on the neighborhood of a pixel. For measuring cornerness, the gradient magnitude of the fitted surface along the edges passing through each point is computed.
Keywords: corner detector, optimization, gradient, facet model
Received December 15, 1989; revised July 15, 1990.
Communicated by J. H. Huang.