Issue No.01 - January (1974 vol.23)
G. Fantauzzi , Societ? Italiana Telecomunicazioni Siemens
Two algorithms are presented for the detection and location of single or multiple stuck faults in a fan-out free combinational circuit. The algorithms are based on a canonic representation of the indistinguishability classes of faults. The number of tests required in these algorithms are shown to be a linear function of the number of gates in the circuit.
Combinational circuits, fan-out free circuits, fault detection, fault diagnosis, fault location, multiple stuck faults, tree circuits.
G. Fantauzzi, A. Marsella, "Multiple-Fault Detection and Location in Fan-Out Free Combinational Circuits", IEEE Transactions on Computers, vol.23, no. 1, pp. 48-55, January 1974, doi:10.1109/T-C.1974.223776