This is a competence project to investigate new testing strategies for embedded software.
The potential customers are US electronic instrument manufactures including Fluke, HP and Intel.
The objective of this project is to develop efficient new testing strategies for devices following a model outside the usual non-software-embedded framework using the concept of Expectation Maximization (EM). The EM approach is attractive because it would provide an efficient method for extending HELP, or other testing tools, to the more complex device model.
Lead Organizational Unit:itl
The following NIST staff are involved in this project: