A New Automatically Generated Metric for Evaluating the Spatial Precision of Deformable Image Registrations: The Distance Discordance Metric
Z Saleh1*, A Apte1, G Sharp2, J Deasy1, (1) Memorial Sloan Kettering Cancer Center, New York, NY, (2) Massachusetts General Hospital, Boston, MAWE-E-213CD-11 Wednesday 2:00:00 PM - 3:50:00 PM Room: 213CD
We propose a new metric called Distance Discordance (DD), which is defined as the distance between two anatomic points from two moving images, which are co-located on some reference image, when deformed onto another reference image.
To demonstrate the concept of DD, we created a reference software phantom which contains two objects. The first object (1) consists of a hollow box with a fixed size core and variable wall thickness. The second object (2) consists of a solid box of fixed size and arbitrary location. 7 different variations of the fixed phantom were created. Each phantom was deformed onto every other phantom using two B-Spline DIR algorithms available in Elastix and Plastimatch. Voxels were sampled from the reference phantom , which were also deformed from moving phantoms [2...6], and we find the differences in their corresponding location on phantom . Each voxel results in a distribution of DD values, which we call distance discordance histogram (DDH). We also demonstrate this concept in 8 Head & Neck patients.
The two image registration algorithms produced two different DD results for the same phantom image set. The mean values of the DDH were slightly lower for Elastix (0-1.28 cm) as compared to the values produced by Plastimatch (0-1.43 cm). The combined DDH for the H&N patients followed a lognormal distribution with a mean of 0.45 cm and std. deviation of 0.42 cm.
The proposed distance discordance (DD) metric is an easily interpretable, quantitative tool that can be used to evaluate the effect of inter-patient variability on the goodness of the registration in different parts of the patient anatomy. Therefore, it can be utilized to exclude certain images based on their DDH characteristics. In addition, this metric does not rely on 'ground truth' or the presence of contoured structures.