<s>
Substrate	B-Algorithm
mapping	I-Algorithm
(	O
or	O
wafer	B-Architecture
mapping	O
)	O
is	O
a	O
process	O
in	O
which	O
the	O
performance	O
of	O
semiconductor	B-Architecture
devices	I-Architecture
on	O
a	O
substrate	B-Architecture
is	O
represented	O
by	O
a	O
map	O
showing	O
the	O
performance	O
as	O
a	O
colour-coded	O
grid	O
.	O
</s>
<s>
The	O
map	O
is	O
a	O
convenient	O
representation	O
of	O
the	O
variation	O
in	O
performance	O
across	O
the	O
substrate	B-Architecture
,	O
since	O
the	O
distribution	O
of	O
those	O
variations	O
may	O
be	O
a	O
clue	O
as	O
to	O
their	O
cause	O
.	O
</s>
<s>
The	O
concept	O
also	O
includes	O
the	O
package	O
of	O
data	O
generated	O
by	O
modern	O
wafer	B-Algorithm
testing	I-Algorithm
equipment	O
which	O
can	O
be	O
transmitted	O
to	O
equipment	O
used	O
for	O
subsequent	O
'	O
back-end	O
'	O
manufacturing	O
operations	O
.	O
</s>
<s>
The	O
initial	O
process	O
supported	O
by	O
substrate	B-Architecture
maps	O
was	O
inkless	B-Algorithm
binning	I-Algorithm
.	O
</s>
<s>
In	O
the	O
very	O
early	O
days	O
of	O
wafer	B-Architecture
test	O
,	O
the	O
dies	O
were	O
put	O
in	O
different	O
bins	O
or	O
buckets	O
,	O
depending	O
on	O
the	O
test	O
results	O
.	O
</s>
<s>
The	O
next	O
step	O
in	O
the	O
process	O
was	O
to	O
mark	O
the	O
failing	O
dies	O
with	O
ink	O
,	O
so	O
that	O
during	O
assembly	O
only	O
uninked	O
dies	O
were	O
used	O
for	O
die	B-Algorithm
attachment	I-Algorithm
and	O
final	O
assembly	O
.	O
</s>
<s>
A	O
wafer	B-Architecture
map	O
is	O
where	O
the	O
substrate	B-Architecture
map	O
applies	O
to	O
an	O
entire	O
wafer	B-Architecture
,	O
while	O
a	O
substrate	B-Architecture
map	O
is	O
mapping	O
in	O
other	O
areas	O
of	O
the	O
semiconductors	O
process	O
including	O
frames	O
,	O
trays	O
and	O
strips	O
.	O
</s>
<s>
It	O
supports	O
many	O
possible	O
substrate	B-Architecture
maps	O
,	O
including	O
the	O
ones	O
named	O
above	O
.	O
</s>
<s>
While	O
the	O
old	O
standards	O
could	O
only	O
support	O
standard	O
bin	O
maps	O
,	O
representing	O
bin	O
information	O
,	O
this	O
standard	O
also	O
support	O
transfermaps	O
,	O
which	O
can	O
help	O
in	O
tracing	O
back	O
dies	O
on	O
strips	O
to	O
the	O
locations	O
they	O
come	O
from	O
off	O
the	O
wafer	B-Architecture
for	O
example	O
.	O
</s>
