<s>
Stress	B-Algorithm
migration	I-Algorithm
is	O
a	O
failure	O
mechanism	O
that	O
often	O
occurs	O
in	O
integrated	O
circuit	O
metallization	O
(	O
aluminum	O
,	O
copper	O
)	O
.	O
</s>
<s>
'	O
Stress	B-Algorithm
migration	I-Algorithm
is	O
often	O
referred	O
as	O
stress	O
voiding	O
,	O
stress	O
induced	O
voiding	O
or	O
SIV	O
.	O
</s>
