<s>
Nanoprobing	B-Algorithm
is	O
method	O
of	O
extracting	O
device	O
electrical	O
parameters	O
through	O
the	O
use	O
of	O
nanoscale	O
tungsten	O
wires	O
,	O
used	O
primarily	O
in	O
the	O
semiconductor	O
industry	O
.	O
</s>
<s>
Commercially	O
available	O
nanoprobing	B-Algorithm
systems	O
are	O
integrated	O
into	O
either	O
a	O
vacuum-based	O
scanning	O
electron	O
microscope	O
(	O
SEM	O
)	O
or	O
atomic	O
force	O
microscope	O
(	O
AFM	O
)	O
.	O
</s>
<s>
Nanoprobing	B-Algorithm
systems	O
that	O
are	O
based	O
on	O
AFM	O
technology	O
are	O
referred	O
to	O
as	O
Atomic	O
Force	O
nanoProbers	O
(	O
AFP	O
)	O
.	O
</s>
<s>
AFM	O
based	O
nanoprobers	O
enable	O
nanometer	O
scale	O
device	O
defect	O
localization	O
and	O
accurate	O
transistor	B-Device
device	O
characterization	O
without	O
the	O
physical	O
damage	O
and	O
electrical	O
bias	O
induced	O
by	O
high	O
energy	O
electron	O
beam	O
exposure	O
.	O
</s>
<s>
For	O
SEM	O
based	O
nanoprobers	O
,	O
the	O
ultra-high	O
resolution	O
of	O
the	O
microscopes	O
that	O
house	O
the	O
nanoprobing	B-Algorithm
system	O
allow	O
the	O
operator	O
to	O
navigate	O
the	O
probe	O
tips	O
with	O
precise	O
movement	O
,	O
allowing	O
the	O
user	O
to	O
see	O
exactly	O
where	O
the	O
tips	O
will	O
be	O
landed	O
,	O
in	O
real	O
time	O
.	O
</s>
<s>
Common	O
nanoprobing	B-Algorithm
techniques	O
include	O
,	O
but	O
are	O
not	O
limited	O
to	O
:	O
</s>
