Pyroelectric Properties of Ferroelectric Lanthanum Bismuth Titanate Thin Films
Ferroelectric and pyroelectric effects in the Lanthanum Bismuth Titanate LaxBi4-xTi3O12 (LBIT) solid solution thin films prepared by Metal Organic Decomposition technique were studied. The films were characterized to understand the effect of La substitution on texture of the films. X-Ray Diffraction, RAMAN spectroscopy and electron microscopy were utilized to study the effect of La on structure of the LBIT thin films. Dielectric, P-E hysterisis and static and dynamic pyroelectric measurements were carried out to study the effect of La substitution on electrical properties. Experimental results indicate that La content affects the development of c-orientation in the structure and induces tetragonality in the structure resulting in improved polarization and dielectric properties. Higher polarization along with reduced Curie temperature due to La addition improves the pyroelectric coefficient as measured with static pyroelectric method. Voltage and detectivity figures of merit were found to be high for high La content in the system. For La = 0.6 figures of merit were found to be comparable to widely studied pyroelectric thin film systems suggesting potential of LBIT thin films for the application in pyroelectric sensors.
School:University of Cincinnati
School Location:USA - Ohio
Source Type:Master's Thesis
Keywords:bismuth titanate ferroelectric properties pyroelectric metal organic decomposition thin films
Date of Publication:01/01/2001