|Publication number||US7262609 B2|
|Application number||US 11/445,856|
|Publication date||Aug 28, 2007|
|Filing date||Jun 3, 2006|
|Priority date||Jun 3, 2005|
|Also published as||EP1886152A1, EP1905154A2, EP2264897A1, US7417441, US7521942, US7777503, US7973542, US20060284639, US20070268026, US20080042661, US20090206852, US20100308847, WO2006133082A1, WO2006133084A2, WO2006133084A3|
|Publication number||11445856, 445856, US 7262609 B2, US 7262609B2, US-B2-7262609, US7262609 B2, US7262609B2|
|Inventors||Joseph Kurth Reynolds|
|Original Assignee||Synaptics Incorporated|
|Export Citation||BiBTeX, EndNote, RefMan|
|Patent Citations (25), Non-Patent Citations (18), Referenced by (70), Classifications (17), Legal Events (4)|
|External Links: USPTO, USPTO Assignment, Espacenet|
This application claims priority of U.S. Provisional Patent Application Ser. Nos. 60/687,012; 60/687,148; 60/687,167; 60/687,039; and 60/687,037, which were filed on Jun. 3, 2005 and Ser. No. 60/774,843 which was filed on Feb. 16, 2006, and are incorporated herein by reference.
The present invention generally relates to capacitance sensing, and more particularly relates to devices, systems and methods capable of detecting a measurable capacitance using switched charge transfer techniques.
Capacitance sensors/sensing systems that respond to charge, current, or voltage can be used to detect position or proximity (or motion or presence or any similar information), and are commonly used as input devices for computers, personal digital assistants (PDAs), media players and recorders, video game players, consumer electronics, cellular phones, payphones, point-of-sale terminals, automatic teller machines, kiosks, and the like. Capacitive sensing techniques are used in applications such as user input buttons, slide controls, scroll rings, scroll strips, and other types of inputs and controls. One type of capacitance sensor used in such applications is the button-type sensor, which can be used to provide information about the proximity or presence of an input. Another type of capacitance sensor used in such applications is the touchpad-type sensor, which can be used to provide information about an input such as the position, motion, and/or similar information along one axis (1-D sensor), two axes (2-D sensor), or more axes. Both the button-type and touchpad-type sensors can also optionally be configured to provide additional information such as some indication of the force, duration, or amount of capacitive coupling associated with the input. Examples of 1-D and 2-D touchpad-type sensor based on capacitive sensing technologies are described in United States Published Application 2004/0252109 A1 to Trent et al. and U.S. Pat. No. 5,880,411, which issued to Gillespie et al. on Mar. 9, 1999. Such 1-D and 2-D sensors can be readily found, for example, in input devices of electronic systems including handheld and notebook-type computers.
A user generally operates a capacitive input device by placing or moving one or more fingers, styli, and/or objects, near the input device an in a sensing region of one or more sensors located on or in the input device. This creates a capacitive effect upon a carrier signal applied to the sensing region that can be detected and correlated to positional information (such as the position(s), proximity, motion(s), and/or similar information) of the stimulus/stimuli with respect to the sensing region. This positional information can in turn be used to select, move, scroll, or manipulate any combination of text, graphics, cursors, highlighters, and/or any other indicator on a display screen. This positional information can also be used to enable the user to interact with an interface, such as to control volume, to adjust brightness, or to achieve any other purpose.
Although capacitance sensors have been widely adopted, sensor designers continue to look for ways to improve the sensors' functionality and effectiveness. In particular, engineers continually strive to reduce the effects of spurious noise on such sensors. Many capacitive sensors, for example, currently include ground planes or other structures that shield the sensing regions from external and internal noise signals. While ground planes and other types of shields held at a roughly constant voltage can effectively prevent some spurious signals from interfering with sensor operation, they can also reduce sensor resolution or increase parasitic effects, such as by increasing parasitic capacitance. Therefore, the performance of such devices is by no means ideal.
Accordingly, it is desirable to provide systems and methods for quickly, effectively and efficiently detecting a measurable capacitance while preventing at least some of the adverse effects that can result from spurious noise signals and/or enhance resolution. Moreover, it is desirable to create a scheme that can be implemented using readily available components, such as standard ICs, microcontrollers, and passive components. Other desirable features and characteristics will become apparent from the subsequent detailed description and the appended claims, taken in conjunction with the accompanying drawings and the foregoing technical field and background.
Methods, systems and devices are described for determining a measurable capacitance for proximity detection in a sensor having a plurality of sensing electrodes and at least one guarding electrode. A charge transfer process is executed for at least two executions. The charge transfer process includes applying a pre-determined voltage to at least one of the plurality of sensing electrodes using a first switch, applying a first guard voltage to the at least one guarding electrode using a second switch, sharing charge between the at least one of the plurality of sensing electrodes and a filter capacitance, and applying a second guard voltage different from the first guard voltage to the at least one guarding electrode. A voltage is measured on the filter capacitance for a number of measurements equal to at least one to produce at least one result to determine the measurable capacitance for proximity detection.
Using the techniques described herein, a guarded capacitance detection scheme may be conveniently implemented using readily available components, and can be particularly useful in sensing the position of a finger, stylus or other object with respect to a capacitive sensor implementing button, slider, cursor control, or user interface navigation functions, or any other functions.
Various aspects of the present invention will hereinafter be described in conjunction with the following drawing figures, wherein like numerals denote like elements, and:
The following detailed description is merely exemplary in nature and is not intended to limit the invention or the application and uses of the invention. Furthermore, there is no intention to be bound by any expressed or implied theory presented in the preceding technical field, background, brief summary or the following detailed description.
According to various exemplary embodiments, a capacitance detection and/or measurement circuit can be readily formulated using two or more switches. Further, a guard signal with two or more guarding voltages can be applied to a guarding electrode using one or more additional switches and one or more passive electrical networks (which can be a simple wire or a complex network); this can be used to shield the sensor from undesired electrical coupling, thereby improving sensor performance. In a typical implementation, a charge transfer process is executed for two or more iterations. In the charge transfer process, a pre-determined voltage is applied to a measurable capacitance using one or more of the switches and a first guarding voltage is applied to a guarding electrode with a second switch, the measurable capacitance then shares charge with a filter capacitance in the passive network and a second guarding voltage is applied to the guarding electrode. With such a charge transfer process, a plurality of applications of the pre-determined voltage and the associated sharings of charge influence the voltage on the filter capacitance. The voltage on the filter capacitance can be the voltage at a node of the circuit that indicates the voltage across the filter capacitance. The voltage on the filter capacitance can also be the voltage across the filter capacitance itself. The charge transfer process thus can be considered to roughly “integrate” charge onto the filter capacitance over multiple executions such that the “output” voltage of the filter capacitance is filtered. The charge transfer process may be done using only switches and passive elements such as resistances, capacitances, and/or inductances. After one or more iterations of the charge transfer process, the voltage on the filter capacitance (which is representative of the charge on the filter capacitance) is measured. One or more measurings can be used to produce one or more results and to determine the measurable capacitance. The measuring of the voltage on the filter capacitance can be as simple as a comparison of the voltage on the filter capacitance with a threshold voltage, or be as complex as a multi-step analog-to-digital conversion extracting charge from the filter capacitance and measuring the voltage multiple times. Using these techniques, capacitive position sensors capable of detecting the presence or proximity of a finger, stylus, or other object can be readily formulated. Additionally, various embodiments of the guard described herein can be readily implemented using only conventional switching mechanisms (e.g. signal pins of a control device) and passive components (e.g. one or more capacitors, resistors, inductors and/or the like), without the need for additional active electronics that would add cost and complexity. The various guarding techniques described herein can use similar components and methods as charge transfer sensing techniques. This, coupled with the ease of multi-channel integration, provide for highly efficient implementation of the guard. As a result, the various guarding schemes (and sensing schemes if desired) described herein may be conveniently yet reliably implemented in a variety of environments using readily-available and reasonably-priced components, as described more fully below.
With reference now to
Measurement of the voltage on the filter capacitance to produce a result (step 824) can take place at any time, including before, after, and during the charge transfer process. In addition, none, one, or multiple measurements of the voltage on the filter capacitance 824 can be taken for each repetition such that the number of measurement results to the number of charge transfer processes performed can be of any ratio, including one-to-many, one-to-one, and many-to-one. Preferably the voltage on filter capacitance is measured when the voltage on the filter capacitance is substantially constant. One or more of the measurement results is/are used in a determination of the value of the measurable capacitance. The value of the measurable capacitance may take place according to any technique. In various embodiments, the determination is made based upon the measurement(s) of the voltage on the filter capacitance (which is indicative of the charge on the filter capacitance), the values of known components in the system (e.g. the filter capacitance), as well as the number of times that the charge transfer process 801 was performed. As noted just previously, the particular number of times that process 801 is performed may be determined according to a pre-determined value, according to the voltage across the filter capacitance crossing a threshold voltage, or any other factor as appropriate.
Steps 802-808 and steps 824 can be repeated as needed (step 810). For example, in a proximity sensor implementation, the measurable capacitance corresponding to each sensing electrode would typically be determined many times per second. This provides the ability to determine the proximity of objects near the sensor, as well as changes to that proximity, and thus facilitates use of the process in a device for user input. Thus, the process can be repeated at a high rate for each sensing electrode each second to enable many determinations of the measurable capacitance per second.
Process 800 may be executed in any manner. In various embodiments, process 800 is executed by software or firmware residing in a digital memory, such as a memory located within or in communication with a controller, or any other digital storage medium (e.g. optical or magnetic disk, modulated signal transmitted on a carrier wave, and/or the like). Process 800 and its various equivalents and derivatives discussed above can also be executed with any type of programmed circuitry or other logic as appropriate.
The steps of applying first and second guard voltages can be implemented with a variety of different techniques and devices. For example, the guard voltages can be provided using switching mechanisms and passive components (e.g. one or more capacitors, resistors, inductors, and/or the like), without the need for additional active electronics that would add cost and complexity (although such active electronics, including DACs and followers, can be used to provide the proper guard voltages at low impedance).
Now with initial reference to
Although a specific configuration of sensor 100 is shown in
The sensing electrodes 112A-C provide the measurable capacitances whose values are indicative of the changes in the electric field associated with stimulus 101. Each of the measurable capacitances represents the effective capacitance of the associated sensing electrode(s) 112A-C detectable by the capacitance sensor 100. In an “absolute capacitance” detecting scheme, the measurable capacitance represents the total effective capacitance from a sensing electrode to the local ground of the system. In a “trans-capacitance” detection scheme, the measurable capacitance represents the total effective capacitance between the sensing electrode and one or more driving electrodes. Thus, the total effective capacitance can be quite complex, involving capacitances, resistances, and inductances in series and in parallel as defined by the sensor design and the operating environment. However, in many cases the measurable capacitance from the input can be modeled simply as a small variable capacitance in parallel with a fixed background capacitance.
To determine the measurable capacitances, appropriate voltage signals are applied to the various electrodes 106, 112A-C using any number of switches 114, 116A-C. In various embodiments, the operation of switches 114, 116A-C is controlled by a controller 102 (which can be a microprocessor or any other controller). By applying proper signals using switches 116A-C, the measurable capacitances exhibited by electrodes 112A-C (respectively) can be determined. Moreover, by applying proper signals using switch(es) 114, suitable guarding voltages can be generated to produce a guard signal 103 that is placed on guarding electrode 106 to shield the measurable capacitances from undesired effects of noise and other spurious signals during operation of sensor 100.
Guarding electrode 106 is any structure capable of exhibiting applied guarding voltages comprising guard signal 103 to prevent undesired capacitive coupling with one or more measurable capacitances. Although
In the exemplary embodiment shown in
The concepts of capacitance sensing in conjunction with guarding can be applied across a wide array of sensor architectures 100, although a particular example is shown in
Operation of sensor 100 suitably involves a charge transfer process and a measurement process facilitated by the use of one or more switches 116A-C, 118 while a guard signal 103 is applied using switch(es) 114. Again, although shown implemented using I/Os of controller 102, switches 114, 116A-C and/or 118 may be implemented with any type of discrete switches, multiplexers, field effect transistors and/or other switching constructs, to name just a few examples. Alternatively, any of switches 114, 116A-C, 118 can be implemented with internal logic/circuitry coupled to an output pin or input/output (I/O) pin of the controller 102, as shown in
One advantage of many embodiments is that a very versatile capacitance sensor 100 can be readily implemented using only passive components in conjunction with a controller 102 that is a conventional digital controller comprised of any combination of one or more microcontrollers, digital signal processors, microprocessors, programmable logic arrays, integrated circuits, other controller circuitry, and/or the like. A number of these controller products are readily available from various commercial sources including Microchip Technologies of Chandler, Ariz.; Freescale Semiconductor of Austin, Tex.; and Texas Instruments of Richardson, Tex., among others. Controller 102 can contain digital memory (e.g. static, dynamic or flash random access memory) that can be used to store data and instructions used to execute the various charge transfer processing routines for the various capacitance sensors contained herein. During operation of various embodiments, the only electrical actuation on the sensing electrodes 112A-C and their associated measurable capacitances that need take place during operation of sensor 100 involves manipulation of switches 114, 116A-C and 118; such manipulation may take place in response to configuration, software, firmware, or other instructions contained within controller 102.
The charge transfer process, which is typically repeated two or more times, suitably involves using a first switch to apply a pre-determined voltage (such as a power supply voltage, battery voltage, ground, or logic signal) to charge the applicable measurable capacitance(s), and then passively or actively allowing the applicable measurable capacitance(s) to share charge with any filter capacitance (e.g. 110) as appropriate. Passive sharing can be achieved by charge transfer through an impedance such as a resistance, and active sharing can be achieved by activating a switch that couples the applicable measurable capacitance(s) to the appropriate filter capacitance(s).
The pre-determined voltage is often a single convenient voltage, such as a power supply voltage, a battery voltage, a digital logic level, a resistance driven by a current source, a divided or amplified version of any of these voltages, and the like. The value of the pre-determined voltage is often known, and often remains constant; however, neither needs be the case so long as the pre-determined voltage remains ratiometric with the measurement of the voltage on the applicable filter capacitance (e.g. 110). For example, a capacitance sensing scheme can involve resetting the filter capacitance to a reset voltage, and also involve measuring a voltage on the filter capacitance by comparing the voltage (as relative to the reset voltage) on one side of the filter capacitance with a threshold voltage (also as relative to the reset voltage). With such a sensing scheme, the difference between the pre-determined voltage and the reset voltage, and the difference between the threshold voltage and the reset voltage, should remain roughly proportional to each other, on average over the executions of the charge transfer process leading to the determination of the measurable capacitance. Thus, the threshold used to measure the change in voltage on the filter capacitance will be proportional to the change in voltage on the filter capacitance due to the charge shared from the measurable capacitance to the filter capacitance during the executions of the charge transfer process for a determination of the measurable capacitance. In particular, where the pre-determined voltage is Vdd and the reset voltage is GND, the threshold voltage can be ratiometric for a CMOS input threshold, for example (½)*(Vdd−GND).
The example shown in
The following discussion describes the operation with one guarding electrode (e.g. 106), one measurable capacitance (e.g. associated with sensing electrodes 112A-C), one filter capacitance 110, and often one passive impedance (e.g. 108A-C). This is done for clarity of explanation, and it is understood that multiple measurable capacitances, passive impedances, and filter capacitances can be included in the system, and they can be operated in serially (at least partially or completely separate in time) or in parallel (at least partially or completely overlapping in time).
After applying the pre-determined voltage to the measurable capacitance, the measurable capacitance is allowed to share charge with filter capacitance. To allow measurable capacitance to share charge, no action may be required other than to stop applying the pre-determined voltage and pause for a time sufficient to allow charge to passively transfer. In various embodiments, the pause time may be relatively short (e.g. if the filter capacitance is connected directly to the measurable capacitance with a small resistance in series), or some delay time may occur (e.g. for charge to transfer through a larger resistance in series with the measurable capacitance, the filter capacitance, and reference voltage). In other embodiments, allowing charge to transfer may involve stopping the application of the pre-determined voltage and actively actuating one or more switches associated with a controller to couple the measurable capacitance and the filter capacitance, and/or taking other actions as appropriate. For example, charge sharing with the filter capacitance could occur in other embodiments using “sigma-delta” techniques; such as in a process whereby the filter capacitance is charged via a measurable capacitance and discharged by a “delta” capacitance (not shown), or vice versa. As another example, charge sharing with the filter capacitance could occur by actuating switches (not shown) that couple and decouple the measurable capacitance with the filter capacitance or that couple and decouple the filter capacitance with a power supply voltage. In such embodiments, impedances such as those shown as 108A-C shown in
A charge transfer process where sharing charge between the measurable capacitance and the filter capacitance occurs using one or more active components (e.g. by actively opening or closing a switch) clearly indicates the beginning and the end of a sharing period with these actuations of the active component(s). Similarly, a charge transfer process where the measurable capacitance is directly connected to one side of the filter capacitance, and the other side of the filter capacitance is coupled, by activating a switch, to a low impedance reference voltage, also clearly indicates the beginning and ending of a sharing period. In contrast, charge transfer processes that passively share charge have less clear denotations of the charge sharing periods. In the systems that passively share charge, the charge sharing period can be considered to begin when the applying of the pre-determined voltage ceases; the charge sharing period must end at or before a subsequent charging pulse begins (for a subsequent execution of the charge transfer process) and at or before a reset of the filter capacitance (if a reset is used and indicates an end a set of charge transfer processes). The sharing period may end before a subsequent charging pulse and before any reset because current flow effectively stops when the voltages are similar enough that negligible charge is shared between the measurable capacitance and the filter capacitance; this will be the case when sufficient time has passed while the measurable capacitance and filter capacitance are coupled to each other. However, even if the voltages do not substantially equalize before a subsequent charging pulse or reset signal, charge sharing still ends when the charging pulse or reset signal begins. This is because the applying of the charging pulse or reset signal dominates over any charge sharing between the measurable capacitance and the filter capacitance in a passive sharing system where the filter capacitance is always coupled to the measurable capacitance (such as in sensor 100 of
The measurement process may be performed at any point of the charge transfer process as appropriate for the sensor configuration and sensing scheme used, and the number of performances of the measurement process may be in any ratio with the performances of the charge transfer process as appropriate for the sensor configuration and sensing scheme used. For example, the measurement process may take place after the sharing of the charge between the measurable capacitance and the filter capacitance brings the voltage on the filter capacitance to be within some percentage point from an asymptote, or the measurement process may take place every time a charge transfer process is performed. Conversely, the measurement process may take place while the pre-determined voltage is applied (if the filter capacitance is properly prevented from charge sharing with the measurable capacitance at that time). The measurement process may take place only for a set number of repetitions of the charge transfer process, or only after a number of repetitions have already taken place. The measuring of the voltage on the filter capacitance can be as simple as a comparison of a voltage on the filter capacitance with a threshold voltage (such as in a “sigma-delta” scheme), or be as complex as a multi-step analog-to-digital conversion (such as when a known number of charge transfer processes are performed and then the voltage on the filter capacitance is read as a multi-bit value). Multiple thresholds can also be used, such as in an oscillator or other dual-slope sensing system where the voltage on the filter capacitance is driven between low and high thresholds, and in multi-bit ADCs where multiple thresholds are used to measure the voltage on the filter capacitance. One or more measurements can be taken, and stored if appropriate, to determine the measurable capacitance as applicable.
More detail about particular capacitance sensing schemes can be found in various literature, in U.S. Pat. Nos. 5,730,165, 6,466,036, and 6,323,846, as well as in U.S. Patent Applications entitled Methods and Systems for Detecting a Capacitance Using Switched Charge Transfer techniques, by David Ely et al, filed Jun. 3, 2006 and Methods and Systems for Detecting a Capacitance Using Sigma-Delta Measurement Techniques, by Kirk Hargreaves et al, filed Jun. 3, 2006. Again, the particular capacitance sensing technique and sensor architecture 100 may vary significantly in other embodiments.
A system without any shields or guards will be affected by the environment. Therefore, as discussed earlier, many capacitive sensors include ground planes or other structures that shield the sensing regions from external and internal noise signals. However, ground planes and other types of shields held at a roughly constant voltage are by no means ideal—they can increase the effects of parasitic capacitance (or other parasitic impedance and associated charge leakage) and reduce resolution or dynamic range. In contrast, a driven, low-impedance guard can provide similar shielding without significantly increasing the effect of parasitic capacitance or reducing resolution. This is done by reducing the charge transferred through any parasitic capacitances associated with any guarding electrode(s) onto any filter capacitance(s) during the course of executions of the charge transfer processes leading to the determination of the measurable capacitance(s). The voltages of the guard can be provided by using an output from a charge transfer process similar to the one to be guarded. This output can be provided as an input to a buffer (or other follower circuit) to guard multiple sensing channels with low impedance. Alternatively, these guard voltages can also be directly provided by using a guard-charge transfer process (one performed for guarding purposes) that inherently provides a low impedance guard signal such that no additional buffering is needed; this guard-charge transfer process could also be similar to the charge transfer process used for sensing, but that is not required.
The typical charge transfer sensing scheme will perform the charge transfer processes multiple times (and often hundreds of times or more) to generate the measurement(s) that are used for one determination of the measurable capacitance. This set of charge transfer processes that lead to the measurement(s) used for one determination varies between embodiments. As four examples, the set can be between a reset state and a final-threshold-state for systems that charge to threshold(s); the set can be between an initial state and a final-read-state for systems that perform a set number of charge transfer processes and read one or more multi-bit voltage output(s); the set can be between the low and high thresholds for dual slope or oscillator systems; the set can also be the sample length of a digital filter for sigma-delta systems. This set of charge transfer processes defines a set where the overall guarding effect is considered, or “the course of executions of the charge transfer processes leading to the determination of the measurable capacitance.”
To reduce the net charge transferred through the parasitic capacitance associated with the guarding electrode onto the filter capacitance during the course of executions of the charge transfer processes leading to the determination of the measurable capacitance(s), a guard signal with proper guarding voltages can be applied. The applying of the pre-determined charging voltage to the measurable capacitance lasts for some duration of time, and before this duration ends, a first guarding voltage similar to this pre-determined voltage can be applied to the appropriate guarding electrode. Since the pre-determined voltage is typically fairly constant, the first guarding voltage can often be a single, roughly constant voltage. Then, before all the charge is shared (i.e., before charge sharing ends) between the measurable capacitance and associated filter capacitance, the guard signal applied to the guarding electrode may be changed to a second guarding voltage similar to the voltage on the associated filter capacitance. Again, although the singular is used in this discussion, there can be any number of guarding electrodes, measurable capacitances, impedances, filter capacitances, and the like involved.
In the embodiment shown in
The guarding voltages of guard signal (VG) 103 may be generated in any manner. Even though the embodiment shown in
In the embodiment shown in
In one embodiment, guard signal 103 includes voltages that are approximately equal to voltages associated with the charge transfer process. Guard signal 103 includes an “approximate-charging-voltage” that approximates the pre-determined voltage applied to any “active” sensing electrode(s) to charge them during the charging period (e.g. one or more of the sensing electrodes 112A-C associated with measurable capacitances). Guard signal 103 also includes an “approximate-sharing-voltage” that approximately equals the voltage associated with any “active” sensing electrodes being shared with the filter capacitance 110 during the sharing period when charge sharing is allowed. In this embodiment, the guarding signal 103 begins applying the approximate-charging-voltage to the guarding electrode 106 before the applying of the pre-determined voltage ends (i.e. before the charging period terminates). The approximate-charging-voltage can be applied at other times as well, such as during the entire charging period or during other portions of the charging period. There is flexibility in when to apply the approximate-charging-voltage since the active sensing electrodes (e.g. 112A-C) are driven during that period, and any effects of parasitic capacitances coupling guarding electrode 106 to the active sensing electrodes would be negligible. The guard signal 103 changes to begin applying the approximate-sharing-voltage to the guarding electrode 106 before the end of the sharing of the charge between any active sensing electrode (e.g. 112A-C) with the associated filter capacitance 110. Similar to the applying of the approximate-charging-voltage, there is flexibility in when to begin applying the approximate-sharing-voltage. For example, this applying of the approximate-sharing-voltage can take place during the entire duration of the period when charge is allowed to be shared between the active sensing electrodes (e.g. 112A-C) or only near the end of the period. For the guard to be effective, it should typically provide a relatively low impedance when applying these two approximate guarding voltages. However, the guard need not always be driven with a low impedance when not applying these two guarding voltages, though its effectiveness as a guard may be reduced.
The general sensor and guard scheme described above and shown in
With reference to
During the “switched RC time-constant” sensing process shown in timing scheme 150, the measurable capacitance associated with sensing electrode 112A is provided with charging voltage pulses 201 using switch 116A. In this embodiment, switch 116A is implemented using a digital I/O of controller 102. Since a digital I/O can typically provide logic high and low voltages (e.g. Vdd, and GND), it is simple to apply a charge voltage pulse having the pre-determined voltage of Vdd. Between provisions of charging pulses 201, the measurable capacitance associated with sensing electrode 112A is allowed to discharge into filter capacitance 110 via passive impedance 108A. This is noted by the voltage traces for Vx 117A (corresponding to the voltage on the measurable capacitance associated with sensing electrode 112A at the node coupled to switch 116A) and VF 115 (corresponding to the voltage on filter capacitance 110 at the node coupled to I/O 119). Vx 117A rises to the pre-determined voltage (e.g. Vdd) when the pre-determined voltage is applied during the charging period, and then decreases with the time constant defined by the measurable capacitance associated with sensing electrode 112A and passive impedance 108A during the charge sharing period when the measurable capacitance discharges into filter capacitance 110. Meanwhile, the voltage on filter capacitance 110 slowly increases as it is charged by the measurable capacitance associated with sensing electrode 112A during the sharing period. During the sharing period, Vx 117A and VF 115 approach the same value, since the two respective capacitances are sharing charge. In most embodiments, the sharing period will be set long enough to enable Vx 117A and VF 115 to share enough charge such that they are essentially the same by the end of the sharing period. This makes the system less sensitive to timing variations.
Between a previous sharing period and a subsequent charging period, an optional “current canceling” voltage is applied to the measurable capacitance. The timing of the “current canceling” voltage is controlled so the amount of “parasitic” charge removed from the filter capacitance 110 is mostly equal to the amount of “parasitic” charge added to filter capacitance 110 through passive impedance 108A during the charging period, and the measurable capacitance is still left at the proper charging voltage before sharing with the filter capacitance 110. This may allow for a lower value for passive impedance 108A, and faster time constants as a whole without changing the measurable capacitance charge timing requirements.
The input/output pin 119 of controller 102 that provides switch 118 also measures the voltage 115 on the filter capacitance. The I/O 119 suitably contains or connects to a comparator (which is a one-bit quantizer that can be used to provide a signal bit analog-to-digital conversion), Schmitt trigger, CMOS threshold, and/or multi-bit analog-to-digital converter feature that is capable of measuring voltage VF 115 at various times (e.g. 202A-C) when switch 118 is open. When a comparator is used to measure the voltage 115, the VTH can be made roughly equivalent to the midpoint between the high and low logic values to simplify the system. VTH is roughly the midpoint between the high and low logic values with a simple exemplary CMOS threshold.
In the particular embodiment shown in
By tracking the number of charge transfer cycles performed from the applying of the reset signal 203 until the voltage on filter capacitance 110 exceeds the threshold voltage VTH, the measurable capacitance can be effectively determined. That is, the number of repetitions of the charge transfer process performed to produce a known amount of charge on filter capacitance 110 (e.g. as indicated by the voltage at the measured node of the filter capacitance reaching VTH) can be effectively correlated to the actual capacitance of the measurable capacitance. Similarly, the number of oscillations or resets of the filter capacitance 110 occurring for a number of the charge transfer processes can also be used to determine the measurable capacitance.
The embodiment shown in
Reset signal 203 may be provided periodically, aperiodically, or otherwise, and/or may not be provided at all in some embodiments to “reset” the sensor. However, such systems would still exhibit what may be considered a “reset voltage” for guarding purposes. For example, other embodiments utilizing RC networks do not have an equivalent of switch 118 (shown in
Similarly, pre-determined charging voltages may also change for a particular sensing system, but the system will still exhibit what can be considered a “pre-determined charging voltage” for guarding purposes. For example, embodiments using both “charging” and “discharging” cycles may have two or more pre-determined charging voltages producing opposing charge transfer. In these cases, the “charging” pre-determined charging voltage and the “discharging” pre-determined charging voltage can both be used to define the guard signal 103.
In various embodiments, the “threshold” voltage is replaced by an A/D measurement of the voltage on the filter capacitance (or representative of the voltage on the filter capacitance), or by any other voltage determination as appropriate. By tracking the number of charge transfer iterations and/or the resulting voltage on the filter capacitance(s) as appropriate for the sensing scheme chosen, the amount of charge transferred to the filter capacitance(s) from the measurable capacitance(s) can be determined. This amount of charge corresponds to the value of measurable capacitance(s). Again, alternate embodiments may make use of other charge transfer schemes, including any sort of sigma-delta processing whereby the filter capacitance 110 is charged via a measurable capacitance and discharged by a “delta” charge through an impedance (not shown), or vice versa, and the like.
There are many options for guard signal 103 that would be effective, and four such options are shown in
It is understood that multiple types of charge transfer processes may be performed in synchrony or in series. Multiple similar charge transfer processes may be used, for example, to determine multiple measurable capacitances simultaneously or in sequence. Multiple similar charge transfer processes may also be used concurrently to obtain multiple determinations of the same measurable capacitance for a more accurate determination overall. Charge transfer processes that roughly oppose each other in effect may also be used to practice more complex measurement schemes. For example, a first charge transfer process may be used to charge a filter capacitance and a second charge transfer process may be used to discharge the same filter capacitance; one or more measurement(s) may be taken during the charge and discharge of the filter capacitance and used to determine the value of the measurable capacitance. Having such a charge up and charge down scheme may be useful in reducing the effects of environmental changes.
Multiple types of charge transfer processes (with associated guard voltages) can also be used to enhance the effects of guarding. For example, the pulse coded modulation can be considered to be a superimposition of multiple types of charge transfer processes (and associated guard voltages). The pulse coded modulation can thus be considered to repeat one, two, or more types of charge transfer processes (and associated guard voltages) in a particular sequence. These different types of charge transfer processes (and associated guard voltages) can apply the same predetermined voltage and use the same components, but may involve different guard signals. For example, a first charge transfer process (and associated guard voltages) can involve a first guard voltage and a second guard voltage different from the first guard voltage, while a second charge transfer process (and associated guard voltages) can involve a third guard voltage and a fourth guard voltage. In this example, the third guard voltage may be the same as the first guard voltage or the second guard voltage. Similarly, the fourth guard voltage may be the same as the first guard voltage or the second guard voltage. Further, the third guard voltage and the fourth guard voltage may be the same or different. The timing and values of the guard voltages would be determined by the average guard voltage swing appropriate for guarding the applicable sensing electrodes.
For the embodiment shown in
The option shown in trace 205 for guard signal 103 exhibits more discrete changes in guarding voltage and lacks the noticeable time-constant features during a single sharing period associated with the option shown in by 204. This “switched capacitance” option of trace 205 resembles that of a sensing system using a charge transfer process that actively switches to share the charge between an measurable capacitance and its associated filter capacitance instead of passively allowing charge to share through a passive impedance. The option shown in trace 205 applies a second guard voltage that remains relatively constant during a single sharing period but changes over sharing periods, as would be found in a sensor using a “switched capacitance” type technique for its charge transfer process. Circuits and methods for generating this “switched capacitance” option by actuating switches to transfer charge onto the applicable guard capacitances are shown in
These “sensor matching” options for guard signal 103 may be advantageous over options with “simpler” waveforms (such as those shown in traces 206 and 208) in that they can be used to reduce charge transferred to the filter capacitance(s) due to the guarding electrode for every execution of the charge transfer process, and not just the net charge transferred during the course of the executions of the charge transfer processes leading to the determination of the measurable capacitance. This is facilitated by the second guard voltage that changes over repetitions of the charge transfer process. However, any guard signal 103 can be effective if it minimizes the net transfer of charge from the guarding electrode 106 to the filter capacitance 110 occurring during the execution of the set of charge transfer processes that eventually result in the measurement(s) of the voltage on filter capacitance 110 that is/are used to determine the measurable capacitance. This includes guard signal options that match a charge transfer process different from the one used by the sensor system, or ones that match no charge transfer process and simply swing between two or more substantially constant voltages (discussed below).
In many embodiments, it is often more practical to apply a guard signal 103 to guarding electrode 106 that does not minimize charge transferred from the guarding electrode 106 to the filter capacitance 110 during a single execution of the charge transfer process, but does minimize the net transfer of charge during the set of charge transfer processes that eventually result in measurement(s) of the voltage on filter capacitance 110 that are used to determine the applicable measurable capacitance. This can be done with a guard signal 103 that causes charge transfer in a first direction between guarding electrode 106 and filter capacitance 110 during one or more executions of the charge transfer process, and causes charge transfer in a second direction opposite the first direction during other execution(s) of the charge transfer process.
As shown by
For example, one option for guard signal 103 would swing between a first guard voltage approximating the pre-determined voltage and a second guard voltage approximating the average voltage on filter capacitance 110. To determine the average voltage of filter capacitance 110, the voltage on filter capacitance 110 is averaged over the set of charge transfer process that leads up to and generates the measurements of the voltage on filter capacitance 110 used to determine the measurable capacitance. For a given set of values for the expected measurable capacitance, filter capacitance, pre-determined voltage, reset voltage, threshold voltage, and ignoring (or accounting for if the model allows) the effects of any passive impedances, well-known methods can be used to model the circuit and determine what average filter-capacitance-voltage would minimize the effect of any guarded capacitances and provide an effective second guarding voltage. This average filter-capacitance-voltage is taken over discrete points, and is roughly the mean of the voltage on filter capacitance 110 taken over the executions of the charge transfer process between the resetting of the filter capacitance 110 and the last measuring of the filter capacitance 110 used to determine the measurable capacitance. Oftentimes, the change in the voltage on filter capacitance 110 will be roughly linear, such that the average filter-capacitance-voltage will be approximately the midpoint between the reset voltage and the threshold voltage.
It is also noted that these capacitance sensors are sampled systems (either actually or effectively). For example, in the embodiment shown in
To that end, the options for guard signal 103 shown by traces 206 and 208 can be used. In the “switched voltage divider” option shown by trace 206, the actual guard signal 103 may alternate between a first guard voltage value 251 and a second guard voltage value 253 that approximates the “average” value of the voltage 115 on filter capacitance 110. Although this average-VF option has been termed the “switched voltage divider” option, no voltage divider is required; for example, first and second guard voltage values 251 and 253 can be achieved without any voltage dividers when they are power supply voltages, are voltages available through a DAC or another part of the sensor, or are produced using circuitry other than voltage dividers. The “switched voltage divider” term is used simply because a switched voltage divider circuit would likely be used in many embodiments of this type of guard signal. In the embodiment described in
The timing of the guard signal 103 is based upon the timing of the pulses 201 applied to measurable capacitance in that the guard signal 103 has the first guarding voltage value 251 while the charging pulses 201 are applied to the measurable capacitance, and the guard signal 103 has the second guarding voltage value 253 during the charge sharing periods between pulses 201. This timing may be useful in that the guard signal 103 can be driven by existing clocks in the system. However, in practice, the guard signal 103 can be as effective even if it only begins applying the first guarding voltage value 251 sometime after the associated charging pulse 201 begins, as long as the first guarding voltage value begins to be applied before the end of the associated charging pulse 201. Similarly, the guard signal 103 can be as effective even if it does not apply second guarding voltage value 253 for the entire sharing period, as long as it begins to apply this second guarding voltage value 253 before the end of the charge sharing period. The timing of the guard signal 206 may not be exactly matched to the charging pulses 201 for many reasons. For example, imprecise timing may cause the guard signal 103 to start changing to a second guarding voltage before charge sharing between the measurable capacitance and the filter capacitance begins, such that the guarding is less effective; to reduce the effects of such imprecise timing, it may be desirable to extend portions of the guard signal 103.
Trace 208 shows an alternate embodiment for guard signal 103 which can be achieved with fewer components. For example, a single I/O with no additional components can be used to generate trace 208, as shown in
Many changes can be made to the basic structures and operations shown in
Many changes can be made to the basic structures and operations shown in
Turning now to
If any of the switches are enabled with an I/O capable of providing switching and measuring functionality, then the sensing system would have the added option of reading the guard signal 103. This would allow the system to adjust the guard signal 103 dynamically in response to what voltages it reads as provided to guard signal 103 (such as by changing the pulse coding if a pulse coded scheme is available).
Impedances of circuit 104 can be any conventional resistances, inductances, capacitances and/or other impedance elements. Thus, the voltage across an impedance in circuit 104 may be affected by prior history of the nodes connected to the impedance. This “prior history” effect may be especially significant for capacitive and inductive elements, and this effect can be controlled to define the guard signal 103. Any reference sources providing references such as reference voltage can be internal or external to controller 102. Convenient references can be used. For example, a reference voltage may be provided by a power supply voltage (Vdd, GND, −Vdd) or battery voltage, and the like, and the actual reference voltage used may be directly from the source or some version of these voltages adjusted by impedances. In the examples shown in
For the embodiment shown in
An impedance divider is composed of at least two passive impedances in series, where each passive impedance is coupled to at least two nodes. One of these nodes is common to both impedances (“a common node” to which both impedances connect.) The common node serves as the output of the impedance divider. The output of the impedance divider is a function of the voltages and/or currents applied at the “unshared” nodes (the nodes of the two impedances that are not the common node) over time. A simple example of an impedance divider is a voltage divider composed of two capacitances or two resistances. More complex impedance dividers may have unmatched capacitances, resistances, or inductances in series or in parallel. One impedance may also have any combination of capacitive, resistive, and inductive characteristics.
In the exemplary embodiment of guard voltage generating circuit 104B shown in
The embodiments of guard voltage generating circuit 104 shown in
The example circuit 104G shown in
The example circuit 104H shown in
The example guard signal generating circuit 104I shown in
The signal 103 of circuit 104I can be further adapted with pulse coded modulation of the switching of switch 332. By changing the frequency of the switching and thus the transition between the guard voltages, a different actual guard voltage swing can be generated. Pulse coded modulation can actually be applied to any circuit 104 when control of the frequency of transition is available. However, in cases where the guard signal 103 already approximates the actual voltage 117 exhibited by the measurable capacitance or its average, pulse coding may offer little or no advantage.
The example guard signal generating circuit 104J shown in
As discussed earlier, in all of the examples 4A-4E where the switching is generated using a component that also has measurement capabilities, such as using a digital I/O of a controller, the I/O can also be used to measure the voltage of guard signal 103 as to adjust the guard signal 103 as necessary. The adjustment may take place for the current set of executions of charge transfer processes used to generate the measurement(s) for determining the measurable capacitance, or may take place for the next set of charge transfer processes.
As noted above, many of the embodiments described herein may be readily implemented using commercially-available components such as conventional integrated circuits and any combination of discrete resistors and/or capacitors. Because of this simplicity, many different types of sensors 100 can be created that share or do not share various components and/or switches. For example, the measurable capacitances associated with the sensing electrodes 112A-C in
By implementing multiple sensing channels on a common controller 102, a number of efficiencies can be realized. Frequently, sensing electrodes and/or guarding electrode(s) can be readily formed on a standard printed circuit board (PCB), so duplication of these elements is relatively inexpensive in a manufacturing sense. In a case where the measurable capacitances are expected to be relatively small, then filter capacitance 110 may also be manufacturable in a PCB. In addition, none or one or more resistances, capacitances, and inductances may be formed on a PCB to provide impedances used in the guard voltage generating circuit 104, such as capacitance 404 and resistance 406 of circuit 104F. As a result, many of the various features described above can be readily implemented using conventional manufacturing techniques and structures. However, in some cases, components such as filter capacitance(s) and/or passive impedance(s) and other impedances may be large enough or require tight enough tolerances to warrant discrete components in many embodiments. In those cases, these components (e.g. filter capacitance 110) may be implemented with one or more discrete capacitors, resistors, inductors, and/or other discrete components.
Moreover, the total number of signal pins (e.g. those of ADCs and I/Os) required and the number of components can be even further reduced through use of time, frequency, encoding or other multiplexing technique.
Arranging the sensing electrodes 112A-B in any number of patterns also allows for many diverse types of sensor layouts (including multi-dimensional layouts found in touchpads capable of sensing in one, two or more-dimensions) to be formulated. Alternatively, multiple “button”-type touch sensors and combinations of button-type and touchpad-type input devices can be readily formed from the various channels, or any number of other sensor layouts could be created.
As stated above, the devices and methods for determining capacitance are particularly applicable for use in proximity sensor devices. Turning now to
Proximity sensor device 11 includes a controller 19 and a sensing region 18. Proximity sensor device 11 is sensitive to the position of a stylus 114, finger and/or other input object within the sensing region 18 by measuring the resulting capacitance. “Sensing region” 18 as used herein is intended to broadly encompass any space above, around, in and/or near the proximity sensor device 11 wherein the sensor is able to detect a position of the object. In a conventional embodiment, sensing region 18 extends from the surface of the sensor in one or more directions for a distance into space until signal-to-noise ratios prevent object detection. This distance may be on the order of less than a millimeter, millimeters, centimeters, or more, and may vary significantly with the size of sensing electrodes, type of position sensing technology used, and the accuracy desired. Accordingly, the planarity, size, shape and exact locations of the particular sensing regions 18 will vary widely from embodiment to embodiment.
In operation, proximity sensor device 11 suitably detects a position of stylus 14 by measuring the measurable capacitance associated with the plurality of electrodes and finger or other input object within sensing region 18, and using controller 9, provides electrical or electronic indicia of the position to the electronic system 10. The system 10 appropriately processes the indicia to accept inputs from the user, to move a cursor or other object on a display, or for any other purpose.
In a common implementation of a touch sensor device a voltage is typically applied to create an electric field across a sensing surface. A capacitive proximity sensor device 11 would then detect the position of an object by detecting changes in capacitance caused by the changes in the electric field due to the object. For example, the sensor of proximity sensor device 11 can use arrays of capacitive sensing electrodes to support any number of sensing regions. As another example, the sensor can use capacitive sensing technology in combination with resistive sensing technology to support the same sensing region or different sensing regions. Depending on sensing technique used for detecting object motion, the size and shape of the sensing region, the desired performance, the expected operating conditions, and the like, proximity sensor device 11 can be implemented with a variety of different ways. The sensing technology can also vary in the type of information provided, such as to provide “one-dimensional” position information (e.g. along a sensing region) as a scalar, “two-dimensional” position information (e.g. horizontal/vertical axes, angular/radial, or any other axes that span the two dimensions) as a combination of values, and the like.
The controller 19, sometimes referred to as a proximity sensor processor or touch sensor controller, is coupled to the sensor and the electronic system 10. In general, the controller 19 measures the capacitance using any of the various techniques described above, and communicates with the electronic system. The controller 19 can perform a variety of additional processes on the signals received from the sensor to implement the proximity sensor device 11. For example, the controller 19 can select or connect individual sensing electrodes, detect presence/proximity, calculate position or motion information, and report a position or motion when a threshold is reached, and/or interpret and wait for a valid tap/stroke/character/button/gesture sequence before reporting it to the electronic system 10, or indicating it to the user. The controller 19 can also determine when certain types or combinations of object motions occur proximate the sensor.
In this specification, the term “controller” is defined to include one or more processing elements that are adapted to perform the recited operations. Thus, the controller 19 can comprise all or part of one or more integrated circuits, firmware code, and/or software code that receive electrical signals from the sensor, measure capacitance of the electrodes on the sensor, and communicate with the electronic system 10. In some embodiments, the elements that comprise the controller 19 would be located with or near the sensor. In other embodiments, some elements of the controller 19 would be with the sensor and other elements of the controller 19 would reside on or near the electronic system 100. In this embodiment minimal processing could be performed near the sensor, with the majority of the processing performed on the electronic system 10.
Again, as the term is used in this application, the term “electronic system” broadly refers to any type of device that communicates with proximity sensor device 11. The electronic system 10 could thus comprise any type of device or devices in which a touch sensor device can be implemented in or coupled to. The proximity sensor device could be implemented as part of the electronic system 10, or coupled to the electronic system using any suitable technique. As non-limiting examples the electronic system 10 could thus comprise any type of computing device, media player, communication device, or another input device (such as another touch sensor device or keypad). In some cases the electronic system 10 is itself a peripheral to a larger system. For example, the electronic system 10 could be a data input or output device, such as a remote control or display device, that communicates with a computer or media system (e.g., remote control for television) using a suitable wired or wireless technique. It should also be noted that the various elements (processor, memory, etc.) of the electronic system 10 could be implemented as part of an overall system, as part of the touch sensor device, or as a combination thereof. Additionally, the electronic system 10 could be a host or a slave to the proximity sensor device 11.
It should be noted that although the various embodiments described herein are referred to as “proximity sensor devices”, “touch sensor devices”, “proximity sensors”, or “touch pads”, these terms as used herein are intended to encompass not only conventional proximity sensor devices, but also a broad range of equivalent devices that are capable of detecting the position of a one or more fingers, pointers, styli and/or other objects. Such devices may include, without limitation, touch screens, touch pads, touch tablets, biometric authentication devices, handwriting or character recognition devices, and the like. Similarly, the terms “position” or “object position” as used herein are intended to broadly encompass absolute and relative positional information, and also other types of spatial-domain information such as velocity, acceleration, and the like, including measurement of motion in one or more directions. Various forms of positional information may also include time history components, as in the case of gesture recognition and the like. Accordingly, proximity sensor devices can appropriately detect more than the mere presence or absence of an object and may encompass a broad range of equivalents.
It should also be understood that while the embodiments of the invention are described herein the context of a fully functioning proximity sensor device, the mechanisms of the present invention are capable of being distributed as a program product in a variety of forms. For example, the mechanisms of the present invention can be implemented and distributed as a proximity sensor program on a computer-readable signal bearing media. Additionally, the embodiments of the present invention apply equally regardless of the particular type of signal bearing media used to carry out the distribution. Examples of signal bearing media include: recordable media such as memory cards, optical and magnetic disks, hard drives, and transmission media such as digital and analog communication links.
Various other modifications and enhancements may be performed on the structures and techniques set forth herein without departing from their basic teachings. Accordingly, there are provided numerous systems, devices and processes for detecting and/or quantifying one or more measurable capacitances. While at least one exemplary embodiment has been presented in the foregoing detailed description, it should be appreciated that a vast number of variations exist. The various steps of the techniques described herein, for example, may be practiced in any temporal order, and are not limited to the order presented and/or claimed herein. It should also be appreciated that the exemplary embodiments described herein are only examples, and are not intended to limit the scope, applicability, or configuration of the invention in any way. Various changes can therefore be made in the function and arrangement of elements without departing from the scope of the invention as set forth in the appended claims and the legal equivalents thereof.
|Cited Patent||Filing date||Publication date||Applicant||Title|
|US3896425||Oct 16, 1973||Jul 22, 1975||Tyco Laboratories Inc||Proximity detector|
|US4459541||Nov 2, 1981||Jul 10, 1984||A. G. Mestra||Circuit for measuring capacitance|
|US5012124||Jul 24, 1989||Apr 30, 1991||Hollaway Jerrell P||Touch sensitive control panel|
|US5305017||Jul 13, 1992||Apr 19, 1994||Gerpheide George E||Methods and apparatus for data input|
|US5451940||May 22, 1992||Sep 19, 1995||Endress U. Hauser Gmbh U. Co.||Capacitive sensor signal processing arrangement using switch capacitor structures|
|US5543591||Oct 7, 1994||Aug 6, 1996||Synaptics, Incorporated||Object position detector with edge motion feature and gesture recognition|
|US5659254||May 31, 1995||Aug 19, 1997||Hitachi, Ltd.||Capacitance type sensor device|
|US5730165||Dec 26, 1995||Mar 24, 1998||Philipp; Harald||Time domain capacitive field detector|
|US5973417||Feb 17, 1998||Oct 26, 1999||E.G.O. Elektro-Geraetebau Gmbh||Circuit arrangement for a sensor element|
|US6323846||Jan 25, 1999||Nov 27, 2001||University Of Delaware||Method and apparatus for integrating manual input|
|US6452514||Jan 26, 2000||Sep 17, 2002||Harald Philipp||Capacitive sensor and array|
|US6466036||Sep 7, 1999||Oct 15, 2002||Harald Philipp||Charge transfer capacitance measurement circuit|
|US6535200||Aug 27, 2001||Mar 18, 2003||Harald Philipp||Capacitive position sensor|
|US6593755||Jul 31, 2000||Jul 15, 2003||Banner Engineering Corporation||Method and apparatus for detection sensor shielding|
|US20030090277||Feb 16, 2001||May 15, 2003||Moritz Lechner||Sensor and sigma-delta converter|
|US20040104826||Oct 30, 2003||Jun 3, 2004||Harald Philipp||Charge transfer capacitive position sensor|
|US20050068712||Aug 9, 2004||Mar 31, 2005||I F M Electronic Gmbh||Capacitive proximity switch|
|US20050099188||Nov 22, 2004||May 12, 2005||Baxter Larry K.||Capacitive measurement system|
|US20060022682 *||Jul 12, 2005||Feb 2, 2006||Fujikura Ltd.||Electrical capacitance proximity sensor|
|EP1521090A2||Sep 29, 2004||Apr 6, 2005||Aisin Seiki Kabushiki Kaisha||Capacitance detection apparatus|
|EP1593988A1||Dec 25, 2003||Nov 9, 2005||Act Elsi Inc.||Electrostatic capacity detection type proximity sensor|
|FR2829317A1||Title not available|
|WO2004059343A1||Dec 25, 2003||Jul 15, 2004||Act Elsi Inc.||Electrostatic capacity detection type proximity sensor|
|WO2004066498A1||Jan 15, 2004||Aug 5, 2004||E.G.O. Elektro-Gerätebau GmbH||Circuit arrangement for a capacitive proximity switch|
|WO2005031375A1||Sep 23, 2004||Apr 7, 2005||Jtag Technologies B.V.||Method and measuring device for determining the capacitanceof a capacitive electrical component connected to an integrated circuit|
|1||Banks; Low Cost, Low Speed A/D Conversion for Embedded Systems; Byte Craft Limited (retrieved on Jul. 25, 2006); Retrieved from Internet: <URL: www.bytecraft.com/addaconv.html>.|
|2||Cao, Y. et al.; High-Accuracy Circuits for On-Chip Capacitance Ratio Testing or Sensor Readout; IEEE Transactions; Sep. 1994; pp. 637-639; vol. 41, No. 9.|
|3||Cichocki, Andrzej et al.; A Switched Capacitor Interface for Capcaitive Sensors Based on Relaxation Oscillators; IEEE; Oct. 1990; pp. 797-799; vol. 39 No. 5.|
|4||Huang, S.M. et al.; Electronic Transducers for Industrial Measurement of Low Value Capacitances; J. Phys. E.: Sci. Instrum. 21; 1988; pp. 242-250.|
|5||Johns, D.A.; Analog Integrated Circuit Design; 1997; pp. 542, 543; John Wiley & Sons.|
|6||Josefsson, O.; Ask the Applications Engineer: Using Sigma-Delta Converters-Part 1; Analog Dialogue 30th Anniversary Reader Bonus; 1997; pp. 29-33.|
|7||Kremin, Victor et al., "Capacitance Sensing-Waterproof Capacitance Sensing-AN2398", Cypress Perform, Document No. 001-14501 Rev., Dec. 8, 2006, pp. 1-11.|
|8||Martin, K.; A Voltage-Controlled Switch Capacitor Relaxation Oscillator; IEEE Journ. of Solid-State Circuits; Aug. 1981; pp. 412-414; vol. SC-16, No. 4.|
|9||Norsworthy, S.; Effective Dithering of Sigma-Delta Modulators; AT&T Bell Laboratories; IEEE; 1992; pp. 1304-1307.|
|10||PCT International Search Report PCT/US2006/021727 Nov. 17, 2006.|
|11||Phillip, H.; Charge Transfer Sensing: Spread Spectrum Sensor Technology Blazes New Applications; Retrieved from Internet: <URL:www.qprox.com/background/white<SUB>-</SUB>paper.php.|
|12||Phillip, Hal; Fingering a Problem; New Electronics; Jan. 24, 2006; pp. 51-52; Retrieved from Internet: <URL:www.newelectronics.co.uk/articles/5676/fingering-a-problem.pdf>.|
|13||Quantum Research Group, "Secrets of a Successful QTouch(TM) Design", Quantum Research Application Note AN-KD02, Rev. 1.03, Oct. 2005, pp. 1-11.|
|14||Seguine, D.; Capacitive Switch Scan; Cypress MicroSystems; Apr. 2005; version 4.2.|
|15||Seguine, D.; Capactive Key Scan; Cypress MicroSystems; Oct. 2004; version 4.1.|
|16||Toth, F.; Design Method. for Low-Cost, High-Perf. Cap. Sensors; Delft Univ. of Tech.; 1997; Retrieved from Internet: <URL: www.exalondelft.nl/download/CapacitiveSensors.PDF>.|
|17||Touch Sensor IC(B6TS). Omron Corporation [retrieved on Aug. 14, 2006]. Retrieved from Internet: <URL:www.omron.co.jp/ecb/products/touch/pdf/en-keisoku.pdf>.|
|18||Yamada, M. et al.; A Switched-Capacitor Interface for Capacitive Pressure Sensors; IEEE; Feb. 1992; pp. 81-86; vol. 31, No. 1.|
|Citing Patent||Filing date||Publication date||Applicant||Title|
|US7521942 *||Oct 29, 2007||Apr 21, 2009||Synaptics, Inc.||Methods and systems for guarding a charge transfer capacitance sensor for proximity detection|
|US7541816||Aug 27, 2008||Jun 2, 2009||Generalplus Technology Inc.||Capacitive sensor|
|US7583092 *||Jul 30, 2007||Sep 1, 2009||Synaptics Incorporated||Capacitive sensing apparatus that uses a combined guard and sensing electrode|
|US7623916 *||Dec 20, 2006||Nov 24, 2009||Cameron Health, Inc.||Implantable cardiac stimulus devices and methods with input recharge circuitry|
|US7649463||Aug 30, 2007||Jan 19, 2010||Keystone Technology Solutions, Llc||Radio frequency identification device and method|
|US7746230||Aug 30, 2007||Jun 29, 2010||Round Rock Research, Llc||Radio frequency identification device and method|
|US7750649 *||Jul 6, 2010||Synaptics Incorporated||Methods and systems for detecting a capacitance using switched charge transfer techniques|
|US7804307||Sep 28, 2010||Cypress Semiconductor Corporation||Capacitance measurement systems and methods|
|US7839285||Nov 23, 2010||Round Rock Resarch, LLC||Electronic communication devices, methods of forming electrical communication devices, and communications methods|
|US7884621||Nov 7, 2007||Feb 8, 2011||Cypress Semiconductor Corporation||Successive approximate capacitance measurement circuit|
|US7902842 *||Mar 8, 2011||Synaptics Incorporated||Methods and systems for switched charge transfer capacitance measuring using shared components|
|US7948382 *||Sep 11, 2006||May 24, 2011||Round Rock Research, Llc||Electronic communication devices, methods of forming electrical communication devices, and communications methods|
|US7973542||Aug 13, 2010||Jul 5, 2011||Synaptics Incorporated||Methods and systems for guarding a charge transfer capacitance sensor for proximity detection|
|US7977954||Jul 12, 2011||Synaptics Incorporated||Methods and systems for sigma delta capacitance measuring using shared components|
|US8004497||Aug 23, 2011||Cypress Semiconductor Corporation||Two-pin buttons|
|US8018340||Oct 24, 2006||Sep 13, 2011||Round Rock Research, Llc||System and method to track articles at a point of origin and at a point of destination using RFID|
|US8040142||Mar 28, 2007||Oct 18, 2011||Cypress Semiconductor Corporation||Touch detection techniques for capacitive touch sense systems|
|US8089289||Jul 2, 2008||Jan 3, 2012||Cypress Semiconductor Corporation||Capacitive field sensor with sigma-delta modulator|
|US8321174||Sep 26, 2008||Nov 27, 2012||Cypress Semiconductor Corporation||System and method to measure capacitance of capacitive sensor array|
|US8358142||Feb 27, 2009||Jan 22, 2013||Cypress Semiconductor Corporation||Methods and circuits for measuring mutual and self capacitance|
|US8410932||Jul 1, 2010||Apr 2, 2013||Huf Hulsbeck & Furst Gmbh & Co. Kg||Capacitive sensor arrangement with a sensor electrode, a screen electrode and a background electrode|
|US8487639||Nov 23, 2009||Jul 16, 2013||Cypress Semiconductor Corporation||Receive demodulator for capacitive sensing|
|US8519973||Apr 9, 2012||Aug 27, 2013||Cypress Semiconductor Corporation||Apparatus and methods for detecting a conductive object at a location|
|US8525798||Feb 29, 2008||Sep 3, 2013||Cypress Semiconductor Corporation||Touch sensing|
|US8536880 *||Aug 20, 2008||Sep 17, 2013||Atmel Corporation||Capacitive sensor with additional noise-registering electrode|
|US8536902||Nov 21, 2011||Sep 17, 2013||Cypress Semiconductor Corporation||Capacitance to frequency converter|
|US8570052||Oct 31, 2012||Oct 29, 2013||Cypress Semiconductor Corporation||Methods and circuits for measuring mutual and self capacitance|
|US8570053||Feb 23, 2009||Oct 29, 2013||Cypress Semiconductor Corporation||Capacitive field sensor with sigma-delta modulator|
|US8575947||Jan 11, 2013||Nov 5, 2013||Cypress Semiconductor Corporation||Receive demodulator for capacitive sensing|
|US8674950||Aug 29, 2008||Mar 18, 2014||Cypress Semiconductor Corporation||Dual-sensing-mode touch-sensor device|
|US8692563||Dec 19, 2012||Apr 8, 2014||Cypress Semiconductor Corporation||Methods and circuits for measuring mutual and self capacitance|
|US8866500||Jul 22, 2009||Oct 21, 2014||Cypress Semiconductor Corporation||Multi-functional capacitance sensing circuit with a current conveyor|
|US8879141 *||Nov 14, 2013||Nov 4, 2014||Qualcomm Mems Technologies, Inc.||Analog interferometric modulator|
|US8970229||Sep 16, 2013||Mar 3, 2015||Atmel Corporation||Capacitive sensor with reduced noise|
|US9104273||Mar 2, 2009||Aug 11, 2015||Cypress Semiconductor Corporation||Multi-touch sensing method|
|US9110544||May 18, 2012||Aug 18, 2015||Nuvoton Technology Corporation||Touch sensing method and touch sensing apparatus of charge distribution type|
|US9154160||Mar 16, 2011||Oct 6, 2015||Cypress Semiconductor Corporation||Capacitance to code converter with sigma-delta modulator|
|US9166621||Jun 13, 2013||Oct 20, 2015||Cypress Semiconductor Corporation||Capacitance to code converter with sigma-delta modulator|
|US9268441||Sep 30, 2011||Feb 23, 2016||Parade Technologies, Ltd.||Active integrator for a capacitive sense array|
|US9268989||Sep 15, 2015||Feb 23, 2016||Apple Inc.||Capacitive sensor packaging|
|US9274643||Mar 30, 2012||Mar 1, 2016||Synaptics Incorporated||Capacitive charge measurement|
|US9305959||Jun 3, 2014||Apr 5, 2016||Apple Inc.||Biometric sensor chip having distributed sensor and control circuitry|
|US20010002826 *||May 4, 1999||Jun 7, 2001||Mark E. Tuttle||Embedded circuits|
|US20060097849 *||Dec 19, 2005||May 11, 2006||Dando Ross S||Wireless communication devices and methods of forming and operating the same|
|US20070007345 *||Sep 11, 2006||Jan 11, 2007||Tuttle Mark E||Electronic communication devices, methods of forming electrical communication devices, and communications methods|
|US20070040685 *||Oct 24, 2006||Feb 22, 2007||Tuttle John R||Miniature radio frequency transceiver|
|US20070268265 *||May 18, 2006||Nov 22, 2007||Cypress Semiconductor Corporation||Two-pin buttons|
|US20070290812 *||Aug 30, 2007||Dec 20, 2007||Tuttle John R||Miniature Radio Frequency Transceiver|
|US20070290863 *||Aug 30, 2007||Dec 20, 2007||Tuttle John R||Radio Frequency Identification Device And Method|
|US20080042661 *||Oct 29, 2007||Feb 21, 2008||Synaptics Incorporated||Methods and systems for guarding a charge transfer capacitance sensor for proximity detection|
|US20080116904 *||Oct 26, 2007||May 22, 2008||Synaptics Incorporated||Methods and systems for switched charge transfer capacitance measuring using shared components|
|US20080129510 *||Aug 30, 2007||Jun 5, 2008||Tuttle John R||Radio Frequency Identification Device And Method|
|US20080154350 *||Dec 20, 2006||Jun 26, 2008||Cameron Health, Inc.||Implantable cardiac stimulus devices and methods with input recharge circuitry|
|US20080291027 *||Sep 13, 2007||Nov 27, 2008||Lake Rickie C||Thin Profile Battery Bonding Method, Method Of Conductively Interconnecting Electronic Components, Battery Powerable Apparatus, Radio Frequency Communication Device, And Electric Circuit|
|US20090033343 *||Jul 30, 2007||Feb 5, 2009||Reynolds Joseph K||Capacitive sensing apparatus that uses a combined guard and sensing electrode|
|US20090066669 *||Aug 29, 2008||Mar 12, 2009||Dana Jon Olson||Dual-sensing-mode touch-sensor device|
|US20090174416 *||Mar 13, 2009||Jul 9, 2009||Synaptics Incorporated||Methods and systems for detecting a capacitance using switched charge transfer techniques|
|US20100052700 *||Sep 3, 2009||Mar 4, 2010||Rohm Co., Ltd.||Capacitive sensor|
|US20100301879 *||Aug 20, 2008||Dec 2, 2010||Harald Philipp||Capacitive sensor with additional electrode|
|US20100308847 *||Dec 9, 2010||Synaptics Incorporated||Methods and systems for guarding a charge transfer capacitance sensor for proximity detection|
|US20110001494 *||Aug 16, 2010||Jan 6, 2011||Synaptics Incorporated||Methods and systems for sigma delta capacitance measuring using shared components|
|US20110001549 *||Jan 6, 2011||Huf Hulsbeck & Furst Gmbh & Co. Kg||Capacitive sensor arrangement with a sensor electrode, a screen electrode and a background electrode|
|US20110043478 *||Jan 15, 2009||Feb 24, 2011||Kenichi Matsushima||Proximity detection device and proximity detection method|
|US20110187389 *||Sep 10, 2008||Aug 4, 2011||Pointchips Co., Ltd.||Capacitance measuring circuit for touch sensor|
|US20140210764 *||Jan 29, 2013||Jul 31, 2014||Synaptics Incorporated||Input device|
|US20140285217 *||Jun 21, 2012||Sep 25, 2014||Huf Hulsbeck & Furst Gmbh & Co.||Capacitive sensor array and method for detecting actuation gestures at a motor vehicle|
|US20140285220 *||Feb 24, 2014||Sep 25, 2014||Azoteq (Pty) Ltd||Parasitic capacitance cancellation in capacitive measurement|
|USRE42773||Oct 4, 2011||Round Rock Research, Llc||Method of manufacturing an enclosed transceiver|
|DE102009031824A1 *||Jul 3, 2009||Jan 5, 2011||Huf Hülsbeck & Fürst Gmbh & Co. Kg||Kapazitive Sensoranordnung mit einer Sensorelektrode, einer Schirmelektrode und einer Hintergrundelektrode|
|WO2009032304A1 *||Sep 5, 2008||Mar 12, 2009||Cypress Semiconductor Corporation||Dual-sensing-mode touch-sensor device|
|U.S. Classification||324/678, 324/688|
|Cooperative Classification||H03K17/965, H03K17/955, H03K2217/960775, H03K2017/9602, G01R27/2605, H03K17/962, G01D5/24, H03K2217/96058, H03K2217/960725|
|European Classification||H03K17/965, G01D5/24, H03K17/96C, G01R27/26B, H03K17/955|
|Aug 29, 2006||AS||Assignment|
Owner name: SYNAPTICS INCORPORATED, CALIFORNIA
Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNOR:REYNOLDS, JOSEPH KURTH;REEL/FRAME:018192/0765
Effective date: 20060828
|Feb 28, 2011||FPAY||Fee payment|
Year of fee payment: 4
|Oct 3, 2014||AS||Assignment|
Owner name: WELLS FARGO BANK, NATIONAL ASSOCIATION, NORTH CARO
Free format text: SECURITY INTEREST;ASSIGNOR:SYNAPTICS INCORPORATED;REEL/FRAME:033888/0851
Effective date: 20140930
|Mar 2, 2015||FPAY||Fee payment|
Year of fee payment: 8