|Publication number||US6950490 B1|
|Application number||US 10/751,673|
|Publication date||Sep 27, 2005|
|Filing date||Jan 5, 2004|
|Priority date||Jan 5, 2004|
|Publication number||10751673, 751673, US 6950490 B1, US 6950490B1, US-B1-6950490, US6950490 B1, US6950490B1|
|Inventors||Yongseon Koh, Jitendra Mohan|
|Original Assignee||National Semiconductor Corporation|
|Export Citation||BiBTeX, EndNote, RefMan|
|Patent Citations (2), Referenced by (4), Classifications (11), Legal Events (3)|
|External Links: USPTO, USPTO Assignment, Espacenet|
The subject matter of this application is related to the subject matter disclosed in commonly assigned, co-pending U.S. patent application Ser. No. 10/751,674 entitled “METHOD FOR GENERATING NON-OVERLAPPING N-PHASES OF DIVIDE-BY-N CLOCKS WITH PRECISE 1/N DUTY RATIO USING A SHIFT REGISTER” and filed on an even date herewith, the subject matter of which is incorporated by reference herein.
The present invention is directed, in general, to clock frequency dividers and, more specifically, to fault state detection for a ring counter in a clock frequency divider employed in dividing a clock signal into N signals each with a 1/N duty ratio and non-overlapping asserted phases.
N phases of divide-by-N clocks with a 1/N duty ratio may be utilized to serialize N bits of parallel data into a serial data stream using a multiplexer. One method of generating N phases of divide-by-N clocks with a 1/N duty ratio is to use an N-bit ring counter, illustrated for a divide-by-5 implementation in
One disadvantage of this method is that when the invalid or fault states occur, the fault states are also passed around the ring indefinitely, such that invalid state detection is required. Fault states can be classified into two types: all zeros and multiple ones. Fault states due to multiple ones may be further classified into two types: two consecutive ones (e.g., 11XXX, where “X” stands for “don't care”) and one followed by another one with delay (e.g., 1X1XX). The 5 valid states and 27 invalid states for a divide-by-5 clock frequency divider with 1/5 duty ratio are illustrated in
The drawback to combinational logic fault state detection is that the circuitry typically introduces large and unbalanced load capacitances, which in turn may cause the phases to overlap and the duty ratio to deviate from 1/N at high operating frequencies.
There is, therefore, a need in the art for improved fault state detection in a clock frequency divider based on a ring counter.
For a more complete understanding of the present invention, and the advantages thereof, reference is now made to the following descriptions taken in conjunction with the accompanying drawings, wherein like numbers designate like objects, and in which:
To address the above-discussed deficiencies of the prior art, it is a primary object of the present invention to provide, for use in a serializing circuit for a communications system, a fault state detector for a ring counter that is formed from unit current sources each switched under the control of a different one of the outputs of the ring counter. The currents switched in that manner are passed through a unit resistance to generate a voltage signal proportional to the number of asserted outputs from the ring counter. The voltage signal is compared to boundary reference values for valid states of the ring counter outputs and, if the voltage signal is not between the boundary reference values, a fault state is indicated.
The foregoing has outlined rather broadly the features and technical advantages of the present invention so that those skilled in the art may better understand the detailed description of the invention that follows. Additional features and advantages of the invention will be described hereinafter that form the subject of the claims of the invention. Those skilled in the art will appreciate that they may readily use the conception and the specific embodiment disclosed as a basis for modifying or designing other structures for carrying out the same purposes of the present invention. Those skilled in the art will also realize that such equivalent constructions do not depart from the spirit and scope of the invention in its broadest form.
Before undertaking the detailed description below, it may be advantageous to set forth definitions of certain words or phrases used throughout this patent document: the terms “include” and “comprise,” as well as derivatives thereof, mean inclusion without limitation; the term “or” is inclusive, meaning and/or; the phrases “associated with” and “associated therewith,” as well as derivatives thereof, may mean to include, be included within, interconnect with, contain, be contained within, connect to or with, couple to or with, be communicable with, cooperate with, interleave, juxtapose, be proximate to, be bound to or with, have, have a property of, or the like; and the term “controller” means any device, system or part thereof that controls at least one operation, whether such a device is implemented in hardware, firmware, software or some combination of at least two of the same. It should be noted that the functionality associated with any particular controller might be centralized or distributed, whether locally or remotely. Definitions for certain words and phrases are provided throughout this patent document, and those of ordinary skill in the art will understand that such definitions apply in many, if not most, instances to prior as well as future uses of such defined words and phrases.
Those skilled in the art will recognize that the full construction and operation of a communications system is not depicted or described herein. Instead, for simplicity and clarity only so much of the construction and operation of a communications system as is unique to the present invention or necessary for understanding the present invention is depicted and described.
In the present invention, fault state detection for a ring counter-based divide-by-N clock frequency divider is based on the observation that the ring counter only has valid states when the number of 1's in the ring is, at any given time, exactly one. In that circumstance, a single pulse with duty ratio 1/N is generated from the N outputs of the ring counter. When the number of 1's becomes zero or two or larger, the ring has fallen into one of the fault states.
The average direct current (DC) voltage of the outputs from the ring counter is directly proportional to the number of 1's in the ring. Accordingly, in the present invention the average DC voltage from the ring counter outputs is obtained and checked for correspondence to the DC voltage representing exactly one single 1 within the ring. The average DC voltage is obtained by converting the logic high voltages into unit currents, summing the units currents (if any), and dumping the currents into a load resistor. Two comparators compare the average DC voltage with two boundary voltages that represent a single 1 within the ring for the DC value check. A fault state is flagged if the DC voltage is not between the two boundary voltages.
Single ended, rail-to-rail logic fault state detector 200 is implemented by a set of source-coupled differential pairs G1–G5. Each differential pair G1–G5 receives a different one of the five rail-to-rail single-ended output clocks Φ1–Φ5 (each operating at one-fifth the frequency f of clock signal CK and with a 1/5 duty ratio) from ring counter 400 at one control input and a reference voltage Ref at the other control input, where the reference voltage Ref is an average of the two supply rails. Each differential pair G1–G5 is configured, and the reference voltage Ref selected, so that when a given clock signal Φ1–Φ5 is a 1, the current through the respective differential pair G1–G5 passes through a left hand branch, while the current through the respective differential pair G1–G5 passes through a right hand branch when a given clock signal Φ1–Φ5 is a 0.
The coupled output of each differential pair G1–G5 is connected by a corresponding current source I1–I5 to ground. The input to the left hand branch of each differential pair G1–G5 is connected to a node N, which is connected in turn by a resistor R1 having a unit resistance R to a supply voltage V. The input to the right hand branch of each differential pair G1–G5 is connected to a node P, which is connected in turn by a resistor R2, also having a unit resistance R, to the supply voltage V. The total current through resistors R1 and R2, summed at nodes N and P from the individual currents through either the left hand branch or the right hand branch of each differential pair G1–G5, define voltages VSN and VSP, respectively.
Either VSN or VSP may be employed to detect a fault state based on the values in TABLE I below:
TABLE I # of 1's VSN VSP Status 0 0 RI 5 RI Fault 1 1 RI 4 RI Valid (3.5 RI < VSP < 4.5 RI) 2 2 RI 3 RI Fault 3 3 RI 2 RI Fault 4 4 RI 1 RI Fault 5 5 RI 0 RI Fault
where RI corresponds to a unit current I (driven by each of current sources I1–I6) through a unit resistance R. The exemplary embodiment utilizes VSP, for which the valid condition is VSP=4 RI, while the neighboring invalid states are VSP=3 RI and VSP=5 RI. Therefore the boundary conditions for the valid states are set as 3.5 RI<VSP<4.5 RI.
Detector 200 determines whether the output for ring counter 400 falls within the boundary conditions with resistors R3 and R4 and integrating comparators C1 and C2. Resistors R3 and R4 are connected in series between the supply voltage V and a unit current source I6 connected to ground, with resistor R3 having a resistance of 3.5 times the unit resistance R and resistor R4 having the unit resistance R. Voltage VSP is received at the negative input to comparator C1 and the positive input to comparator C2, and is compared respectively to a voltage of 3.5 RI, generated by the unit current from current source I6 through resistor R3, and a voltage of 4.5 RI, generated from the unit current from current source I6 through the combined resistances of resistors R3 and R4. The outputs of comparators C1 and C2 are logically combined to produce a fault state output signal indicating whether VSP is greater than 3.5 RI and less than 4.5 RI.
Differential, low swing, current mode logic (CML) fault state detector 201 employs essentially the same construction as detector 200. In the differential case, however, the five phases of clocks Φ1–Φ5 are low-swing differential signals from a differential ring counter-based divide-by-5 clock frequency divider and the valid condition is VS=VSP−VSN=−3 RI, while the neighboring invalid states are VS=−5 RI and VS=−RI. Possible values of VSN, VSP and VS and the corresponding fault status are set forth in TABLE II below:
TABLE II VS = # of 1's VSN VSP VSP − VSN Status 0 0 RI 5 RI −5 RI Fault 1 1 RI 4 RI −3 RI Valid (−4 RI < VS < −2 RI) 2 2 RI 3 RI −RI Fault 3 3 RI 2 RI RI Fault 4 4 RI 1 RI 3 RI Fault 5 5 RI 0 RI 5 RI Fault
Therefore, the boundary conditions for the valid states are set as −4 RI<VS<−2 RI.
Based on those boundary conditions, resistors R3 and R4 in detector 200 are replaced in detector 201 with resistors R5 and R6 each having twice the unit resistance. Differential comparators DC1 and DC2 are employed, with comparator DC1 receiving the supply voltage V and voltage VSN as well as the voltage VSP and the voltage below resistance R5, and comparator DC2 also receiving the supply voltage V and voltage VSN together with the voltage VSP and the voltage below resistance R6.
Fault state detectors 200 and 201 have no mismatched load capacitances. Therefore a precise 1/N duty ratio is guaranteed by the sampling edge of the input clock. Furthermore, since only DC values are of interest, the sampling transistors in the fault detection circuit may be made very small, resulting in low load capacitance and allowing a high operating frequency to be achieved at low power consumption. The present invention is applicable to all semiconductor integrated circuit processes, such as rail-to-rail swing digital complementary metal-oxide-semi-conductor (CMOS) logic, low-voltage swing differential current steering CMOS logic, silicon bipolar junction transistor (BJT) and/or bipolar CMOS (BiCMOS) logic, silicon germanium heterojunction bipolar junction transistor (SiGe HBT) logic, etc.
When an N-bit ring counter is employed as a divide-by-N frequency divider to generate non-overlapping N phases of divide-by=N clocks each with 1/N duty ratio, with exactly 1 bit turned on at all times, fault states may be detected based on the average DC voltage of the outputs from the ring counter, which is proportional to the number of 1's in the ring. By sampling the average DC voltage of the ring counter outputs for comparison to two boundary reference voltages, fault states may be flagged. Load capacitance from such a fault state detection circuit remains low and balanced, allowing a high operating frequency to be achieved at low power consumption.
Although the present invention has been described in detail, those skilled in the art will understand that various changes, substitutions, variations, enhancements, nuances, gradations, lesser forms, alterations, revisions, improvements and knock-offs of the invention disclosed herein may be made without departing from the spirit and scope of the invention in its broadest form.
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|U.S. Classification||377/46, 377/28, 377/122, 377/16, 377/29|
|International Classification||H03K21/40, H03K23/54|
|Cooperative Classification||H03K21/40, H03K23/54|
|European Classification||H03K23/54, H03K21/40|
|Jun 14, 2004||AS||Assignment|
Owner name: NATIONAL SEMICONDUCTOR CORPORATION, CALIFORNIA
Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNORS:KOH, YONGSEON;MOHAN, JITENDRA;REEL/FRAME:015448/0218
Effective date: 20040504
|Mar 27, 2009||FPAY||Fee payment|
Year of fee payment: 4
|Feb 25, 2013||FPAY||Fee payment|
Year of fee payment: 8