Phil D Edmondson
Phil Edmondson studied for his PhD in Salford Physics under the supervision of Prof S E Donnelly – completing a thesis entitled "An in-situ TEM study of the formation and annealing of damage resulting from single ion impacts in crystalline silicon". During completion of his thesis, Phil spent an extended period working at Argonne National Laboratory, USA. While at Argonne, Phil specialised in in-situ TEM (Transmission Electron Microscopy) experiments, namely ion irradiation of silicon.
Phil is currently working as a post-doc on a European-funded project to fabricate a nano-scale, ultra-bright Scanning-Electron-Microscope-on-a-chip using a Focussed Ion Beam as the fabricating tool.
- Phil D Edmondson, "An in-situ TEM study of the formation and annealing of damage resulting from single ion impacts in crystalline silicon" [5 Mb pdf], PhD Thesis, Joule Physics Laboratory, University of Salford
- "Single Ion-Induced Amorphous Zones in Silicon: Formation and Recrystallization", International Conference on Ion-Surface Interactions, Moscow 2005
- "Anomalous annealing behavior of amorphous zone in silicon", NIMB 242 (2006) 595
- "In situ transmission electron microscopy studies of radiation damage in copper indium diselenide", NIMB 242 (2006) 686
- "An in situ transmission electron microscope study of the anomalous annealing of spatially isolated disordered zones in silicon", Journal of Physics: Conference Series 26 (2006) 284