Richardson, A and Sharif, E and Betts, W R (1997) Fault-tolerant and self-testable architectures for zero failure electronics. In: AUTOMOTIVE ELECTRONICS - AUTOTECH'97. IMechE seminar publication ; 1997-10 . MECHANICAL ENGINEERING PUBL, EDMUNDS, pp. 133-142. ISBN 1860581153 9781860581151Full text not available from this repository.
The introduction of new automotive system architectures that exploit the benefits offered by advanced electronic control will require the dependability of the electronic systems to be assured over the vehicle's life, This is particularly important in safety critical subsystems such as braking steering and ride control. Improved processes, designs and minimal connector strategies are all contributing to these goals however, aggressive pricing and specifications are eliminating the possibilities of extensive reliability screening. In addition, degradation mechanisms and intermittent faults still occur in IC's despite radical improvements in processing technology. It is clear therefore that self test and diagnostic strategies are required in addition to techniques that guarantee high reliability levels if ZERO failure electronics is to be realised in modem automotive systems.
|Item Type:||Contribution in Book/Report/Proceedings|
|Additional Information:||Autotech Congress, 4-6 November 1997, National Exhibition Centre, Birmingham, UK. Organized by the Automotive Division of the Institution of Mechanical Engineers|
|Departments:||Faculty of Science and Technology > Engineering|
|Deposited On:||21 Oct 2011 09:55|
|Last Modified:||12 Apr 2016 14:54|
Actions (login required)