Bruker D8 Advance XRD was installed in June 2010. This diffractometer is equipped with a sealed tube Cu-K? x-ray source. The standard sample holder of the diffractometer is a 9 sample changer, making it possible to measure up to 9 samples in a series. The diffractometer uses a 1-D position sensitive detector (LynxEye) based on silicon drift detector technique which reduces the measurement time significantly without a reduction in the diffracted intensity. The maximum global count rate handled by this detector is 108 cps.
Thin film as well as powder (or pellet) samples can be measured using this XRD machine.
Formation of iron nitride thin films with Al and Ti additives, R. Gupta, A. Tayal, S. M. Amir, Mukul Gupta, A. Gupta, M. Horisberger, and J. Stahn, Journal of Applied Physics 111, 103520 (2012).
Surfactant controlled interdiffusion in thermally evaporated Cu/Co multilayers, S. M. Amir, Mukul Gupta and A. Gupta, Journal of Alloys and Compounds 522, 9 (2012)
Sonication induced peptide-appended bolaamphiphile hydrogels for in situ generation and catalytic activity of Pt nanoparticles, I. Maity, D. B. Rasale and A K. Das, Soft Matter doi:10.1039/c2sm25126d The Royal Society of Chemistry (2012).
Synthesis, characterization and catalytic activity of Fe(Salen) intercalated alpha-zirconium phosphate for the oxidation of cyclohexene, S. Khare and R. Chokhare, Journal of Molecular Catalysis A: Chemical 344, 83- 92 (2011).
Surfactant mediated growth of Ti/Ni multilayers, M. Gupta, S. M. Amir, A. Gupta and J. Stahn, Applied Physics Letters 98, 101912 (2011).