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Among the ferroelectric thin films considered for use in nonvolatile memory devices, the ferroelectric copolymer of polyvinylidene fluoride, PVDF (C2H2F2), with trifluoroethylene, TrFE (C2HF3), has distinct advantages, including low dielectric constant, low processing temperature, relative low cost compared with epitaxial ferroelectric oxides, and compatibility with organic semiconductors. We report the operation and polarization retention properties of a metal– ferroelectric–insulator–semiconductor bistable capacitor memory element consisting of an aluminum gate, a P(VDF-TrFE) Langmuir–Blodgett film, a 30 nm cerium oxide buffer layer, and a moderately doped silicon wafer. The device exhibited a 1.9 V wide hysteresis window obtained with a +/-7 V operating range with a state retention time of 10 min. The mechanisms contributing to loss of state retention are discussed.