Pankaj Bhooshan Agarwal @ on
AFM imaging of bare silicon surface to measure its rms roughness
my question is related to AFM imaging of silicon surface. after doing phase (AC mode) imaging of silicon surface. i found the roughness of bare silicon surface is ~ 50 nm. while it should be ~ 0.5 nm. why phase imaging is showing so large roughness ?
with Regards Pankaj