TEM data of the A-plane sample, with viewing direction . (a) Diffraction pattern of the GaN film of the A-plane GaN sample. (b) and (c) show bright field images of the same sample taken in the two beam conditions with = (0002) and , respectively.
Shih et al. Nanoscale Research Letters 2011 6:425 doi:10.1186/1556-276X-6-425