Utilization of Environmental Transmission Microscopy (ETEM) technique, as well as others sate-of-the-art electron microscopy approaches to conduct structural studies of catalyst nanoparticles; III-V nitrides; carbon nanotube nucleation on a catalyst particle in conjunction with chirality selection and growth termination. Combination of available at the CFN techniques allows benefiting from linking controlled real time in-situ observations of catalyst structural and morphological evolution with catalyst activity resulting in tailoring catalyst properties that permits, for example, growth of carbon nanotubes with desired properties. Other interest include developing “operando” technique based on the ETEM that allows to capture structural and spectroscopic information on a sample and reaction products at the same time. In combination with high frame rate image acquiring system installed on the ETEM the developed approach will allow to acquire absolutely unique and most complete data set on the sample at real-world reaction conditions.
A. Kumar, A.A. Voevodin, D. Zemlyanov, D.N. Zakharov, T.S. Fisher, “Rapid synthesis of few-layer graphene over Cu foil”, Carbon 50, no. 4, p. 1546 (2012)
I.H. Wildeson, R. Colby, D.A. Ewoldt, Z. Liang, D.N. Zakharov, N.J. Zaluzec, R.E. Garcia, E.A. Stach, and T.D. Sands, “III-nitride nanopyramid LEDs grown by organometallic vapor phase epitaxy”, J of Appl. Phys. 108, p. 044303 (2010)
A.R. Harutyunyan, G. Chen, T.M. Paronyan, E.M. Pigos, O.A. Kuznetsov, K. Hewaparakrama, S.M. Kim, D. Zakharov, E.A. Stach, G.U. Sumanasekera, “Preferential Growth of Single-Walled Carbon Nanotubes with Metallic Conductivity”, Science 326, no. 5949, pp. 116-120 (2009)
D.N. Zakharov, Z. Liliental-Weber, Y. Gao, and E. Hu, “Structural Defects in Si-doped III-V Nitrides”, J. of Electronic Materials 35, no.7, 1543-6 (2006)
D.N. Zakharov, Z. Liliental-Weber, B. Wagner, Z.J. Reitmeier, E.A. Preble, and R.F. Davis, “Structural TEM study of nonpolar a-plane gallium nitride grown on (1120) 4H-SiC by organometallic vapor phase epitaxy”, Phys. Rev. B 71, 235334-42 (2005)