Scanning Probe Microscopy encompasses a large area of scanning techniques. The Atomic Force Microscope (AFM) is a valuable lab tool for the non-destructive imaging of small features and topography for almost any material. Many qualitative and quantitative sub micron properties such as surface roughness, feature size, and feature depth of a material can be determined using a standard AFM probe pictured below. The AFM can also be used in a quality control capacity to image today’s smaller and smaller manufactured parts.
Figure 1. Cantilever of Olympus AFM probe shown with scanning tip at end.
Figure 2. Image of a nanosensor probe tip.
With an Advanced Research Corporation magnetic coating on the probe, the AFM can be used in Magnetic Force Microscopy (MFM) mode. The MFM can determine perpendicular magnetic domain orientation of written magnetic media as shown below.
Figure 3. MFM binary image with accompanying AFM topological data.
Figure 4. Magnetic binary image with frequency shift scale.
With each MFM scan you also obtain the topography data which can be used to analyze the surface of the sample as well as its magnetic domain orientation in the same selected area. Probes are available in coatings with differing coercivities to accommodate magnetically hard and soft materials without disturbing the existing domain. Probe tips can also be FIB sharpened for a smaller overall tip diameter.