An all-fiber ellipsometer is constructed which uses a polarization-maintaining single-mode fiber as the polarization modulator. It is demonstrated that the all-fiber ellipsometer can be used to determine the optical constants of materials and as a surface state sensor.
© 1984 Optical Society of America
Original Manuscript: October 11, 1983
Published: April 1, 1984
Toshihiko Yoshino and Kiyoshi Kurosawa, "All-fiber ellipsometry," Appl. Opt. 23, 1100-1102 (1984)
J. Opt. Soc. Am.
- R. M. A. Azzam, N. N. Bashara, Ellipsometry and Polarized Light (North Holland, Amsterdam, 1977).
- D. E. Gray, Ed., American Institute of Physics Handbook (McGraw-Hill, New York, 1972), pp. 6–124.
|Alert me when this paper is cited|
OSA is able to provide readers links to articles that cite this paper by participating in CrossRef's Cited-By Linking service. CrossRef includes content from more than 3000 publishers and societies. In addition to listing OSA journal articles that cite this paper, citing articles from other participating publishers will also be listed.