An I-IP based approach for the monitoring of NBTI effects in SoCs
On-Line Testing Symposium, IEEE International
By C. Guardiani, A. Shibkov, A. Brambilla, G. Storti Gajani, D. Appello, F. Piazza, P. Bernardi
Issue Date:June 2009
In this paper we present a design for reliability methodology, with the goal of reducing the impact of transistor V<inf>TH</inf> degradation due for example to phenomena such as NBTI. It uses infrastructure IPs (I-IPs) featuring a self compensa...