Issue No.04 - July/August (2006 vol.23)
Nur A. Touba , University of Texas at Austin
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2006.105
Test data compression consists of test vector compression on the input side and response compaction on the output side. Test vector compression has been an active area of research, yielding a wide variety of techniques. This article summarizes and categorizes these techniques, explaining how they relate to one another. The goal is to provide a framework for understanding the theory and research in this area.
Test Vector Compression
Nur A. Touba, "Survey of Test Vector Compression Techniques", IEEE Design & Test of Computers, vol.23, no. 4, pp. 294-303, July/August 2006, doi:10.1109/MDT.2006.105