CONCORD, CA--(Marketwire - August 17, 2010) -
A new lab-based computed tomography (CT) system, capable of delivering synchrotron-like 3D imaging at 50 nanometer resolution within a laboratory setting, was announced today by Xradia, Inc. The UltraXRM-L200
is the newest addition to the ultra-high resolution UltraXRM™ nanoscale family of X-ray microscopes. The microscope uses state of the art X-ray optics
originally developed for synchrotron research facilities to enable best-in-class resolution and efficiency in lab settings.
"Our commitment is to continually develop systems that move research forward," said Wenbing Yun, Ph.D., founder, president and CTO of Xradia. "Ultimately, in lab settings as well as at synchrotron facilities, where we have a strong leadership position, we want to help researchers focus on their research rather than invest their time and resources into building their own tools. Only Xradia offers X-ray CT microscopes at this resolution level commercially."
Xradia's UltraXRM-L200 microscope combines a high-flux laboratory X-ray source with proprietary X-ray optics into a standalone CT scanner. It addresses a growing range of applications that include advanced materials development, life science studies for soft tissue and bone, rock porosity studies for oil and gas drilling feasibility models, and semiconductor package failure analysis.
According to Dr. Ge Wang, Professor and Director of the Biomedical Imaging Division at Virginia Tech University, "Xradia's ultra-high resolution imaging systems provide us with detailed 3D volumetric data of the internal structures without the need for cutting or sectioning at the region of interest. This extends the capability of any research laboratory as we are able to test results under a variety of conditions, including time-lapsed 4D imaging. The UltraXRM-L200 will help bridge the gap between existing high resolution imaging modalities such as SEM, TEM and AFM, to optical microscopy and traditional microCT imaging systems."
From Synchrotron to Lab
The only instrument in its class, the UltraXRM-L200 enables timely and efficient synchrotron-like measurement results on demand, without the lengthy delays generally incurred when applying for research time at one of the approximately 50 synchrotron X-ray research facilities in the world.
With a resolution as fine as 50 nm, the UltraXRM-L200 provides insight into microscopic structures and processes previously not accessible with conventional lab-based X-ray technology. Operating with 8 keV (kiloelectron volt) X-rays, it enables observation of structures and materials in their natural state.
Unique capabilities of the UltraXRM-L200
- Non-destructive imaging at such high resolution in a lab system is unique to Xradia, and allows repeated imaging of the same sample under different conditions and/or over time, to bring the fourth dimension -- time -- to analysis;
- Best image contrast: absorption and Zernike phase contrast modes allow imaging of a wide variety of sample types, from rocks to advanced materials to soft tissue;
- Versatility: a large working distance and atmospheric sample environment allow in-situ studies;
- Highest resolution for X-ray CT system: two magnifications, 65 micron field of view at 150 nm resolution and 15 micron field of view at 50 nm resolution.
UltraXRM Family of 3D X-ray Microscopes
Besides the UltraXRM-L200 for the laboratory, Xradia offers a range of 3D nanoscale X-ray microscopes for synchrotrons that leverage the high photon flux, energy tunability and monochromaticity available at such facilities. The company also offers the UltraSPX™ family of nanoscale scanning probe x-ray microscopes for synchrotrons. Cryogenic sample handling is available with select synchrotron products to minimize radiation damage to organic specimens.
The UltraXRM-L200 is available to order now. To discuss system requirements and specifications, contact Sales at +1.925.771.8000. For global sales contacts, visit http://www.xradia.com/company/sales-offices.php.
Xradia, Inc. designs and manufactures high-performance X-ray microscopes for industrial and research applications, facilitating discovery and innovation through nondestructive 3D imaging with ultra-high resolution and superior contrast. The company's multi-lengthscale solutions deliver full volume resolution from microns down to 50 nm, while Xradia synchrotron-based microscopes improve resolution down to 30 nm. The ultra-high resolution bridges the gap between traditional optical or CT measurement and electron microscopy.
By enabling quantitative, in situ analysis and characterization for a large range of sample sizes and materials, Xradia products allow for true nondestructive imaging beyond three dimensions, including time lapse imaging under variation of environmental conditions on the same sample and spatial distribution of elemental compositions. These capabilities enable a wide range of applications in the life sciences, geomaterials, advanced materials and semiconductor markets. For more information, visit www.xradia.com.
Xradia, UltraXRM and UltraSPX are trademarks of Xradia, Inc. Other trademarks that may be mentioned in this release are the intellectual property of their respective owners.