Ghosh, Arindam and Guha, Ayan and Raychaudhuri, Arup K (2004) Low-frequency conductance fluctuations in a shape memory alloy near the martensite transition. In: SPIE: Fluctuations and Noise in Materials, 26th May, Canaria Island,Spain, Vol.5469, 51-60.Full text not available from this repository. (Request a copy)
We have investigated the conductance fluctuation in a shape memory alloy (NiTi-Nitinol) near its martensite transition in order to study how the noise evolves near a phase transition that is driven by long range elastic interactions. The alloy has a martensite start and completion temperatures of 333 K and 325 K respectively and change of around 6%-8% in resistance at the transition. The conductance fluctuation (noise) measurements were carried out using a 5-probe ac technique in the temperature interval 200 K to 400 K in wire samples with typical thickness 5 µm and width of 120 µm. The samples were annealed at high temperature to remove any effect of previous temperature or strain cycle. We made the following observations: (1) There is a large change in the measured noise spectral power S(f) at the transition. (2) Away from transition temperature S(f) follows a 1/f-type behavior. This changes drastically near the transition, where large spectral density appears for f <1 Hz, and this strong dependence tends to saturate around 1 mHz. (3) Close to the transition, the probability density function (PDF) deviates from a Gaussian distribution, and shows a significant contribution from a power-law distribution. (4) When the transition is tuned by an applied constant stress (staying close to but below the transition temperature range), a similar strongly frequency-dependent low frequency S(f) appears, accompanied by a non-Gaussian PDF with a power-law statistics.
|Item Type:||Conference Paper|
|Additional Information:||The copyright belongs to The International Society for Optical Engineering.|
|Department/Centre:||Division of Physical & Mathematical Sciences > Physics|
|Date Deposited:||30 Nov 2006|
|Last Modified:||27 Aug 2008 11:57|
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