Plane-view bright-field image (a) and the corresponding electron diffraction pattern (b) from sample S-30 min. Si and PtSi rings are revealed, while no Pt rings are detected. The nanofeatures on the plane-view image seem to be holes corresponding to the footprint of nanocrystals that were probably removed during sample preparation. Their diameter is larger than the PtSi nanoparticles observed in sample S-15 min.
Michelakaki et al. Nanoscale Research Letters 2011 6:414 doi:10.1186/1556-276X-6-414