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The nanomagnetic behavior of Co–C nanodot arrays was investigated by magnetic force microscopy (MFM) and an alternative gradient force magnetometer. The direction of the easy axis can be observed directly with MFM by comparing the saturated magnetization state and the remanent magnetization state. Interaction of the domain wall with local defects was observed by field dependent MFM measurements. Some types of defects that can pin domain wall movement were identified.