Submitted to: CDFA Pierce's Disease Control Program Research Symposium
Publication Type: Abstract Only
Publication Acceptance Date: November 26, 2008
Publication Date: December 15, 2008
Citation: Rogers, E.E. 2008. Evaluation of Arabidopsis thaliana as a model host for Xylella fastidiosa [abstract]. CDFA Pierce's Disease Control Program Research Symposium, December 15-17,2008, San Diego, California. Technical Abstract: Pierce’s disease of grapes and almond leaf scorch are devastating diseases caused by the bacterium Xylella fastidiosa (Xf). To date, progress in determining the mechanisms of host plant succeptibility, tolerance or resistance has been slow, due in large part to the long generation time and limited available genetic resources for grape, almond and other known hosts of Xf. The model plant Arabidopsis thaliana is an ideal system for rapid progress in genetic and pathological studies. There are many publically available genetic resources for Arabidopsis and it has a short generation time. Here we report work evaluating Arabidopsis as a host for Xf. A pin-prick inoculation method has been developed and Xf can be detected by microscopy and PCR. Xf has also be re-isolated from infected Arabidopsis tissue. Timcourses following Xf growth and changes in pathogenesis-related gene expression are in progress, as is the testing of various pathogenesis -related mutants and Arabidopsis ecotypes.