Diffraction profiles. Diffraction profiles through the in-plane (2-20) reflection of samples A1, B1, C1, a2, and b2 taken at α∥ = 0.15°. With increasing growth time, the islands grow and relax laterally towards the bulk lattice parameter reached for sample C1 (arrow).
Davydok et al. Nanoscale Research Letters 2012 7:109 doi:10.1186/1556-276X-7-109