In fact, feeding back cloud-based analysis to improve manufacturing test is an emerging application. "Advantest Cloud Solutions (ACS), when used in combination with embedded sensors in chip design (IP provided by multiple partners), provides comprehensive insights for root cause analysis of silent data corruption (SDC) issues," said Keith Schaub, vice president, technology and strategy at Advantest America. "Embedded sensors enable the collection and monitoring of health data across the entire chip area throughout the device's test lifecycle, as well as field use.